News & events - Xenocs

Events

XTOP 2024

Xenocs is pleased to attend the 15th Conference of High Resolution X-ray Diffraction and Imaging, taking place in Carry-le-Rouet, France, from March 17th to 22nd, 2024. Meet us at our booth!

News

New: InXight DF-PCI X-ray imaging module

Reveal nanostructure differences, interfaces and orientation with InXight DF-PCI option for the Xeuss 3.0 SAXS/WAXS instrument

Events

NESBA BIO-SAXS Symposia

24 January, 2024. Xenocs is pleased to sponsor and attend the NESBA BIO-SAXS Symposia on January 24 in Boynton Yards, Somerville, MA, USA. Let's meet!

Events

NSSM 2024

9-10 January, 2024. Xenocs will attend the 20th Nordic Workshop on Scattering from Soft Matter from January 9-10 in Uppsala, Sweden. Let's meet!

Events Type of articles

SAXS Workshop – SAIF/CRNTS, IIT Bombay

Xenocs is pleased to be part of the upcoming workshop on “Small Angle X-Ray Scattering for Colloids, Polymers and Biological Systems”.

Events

CompFlu-2023

18-20 December, 2023. Xenocs is pleased to attend the CompFlu-2023 Conference from December 18-20 at IIT Madras, Chennai, India. Meet us at our booth!

Events

BatSynch – Elettra Sincrotrone Trieste

29-30 November, 2023. Xenocs is pleased to attend the BatSynch - The Battery Challenge at Synchrotrons organised by Elettra Sincrotrone Trieste from November 29-30 in Trieste, Italy. Meet us at our booth!

Events

Rayons X et Matière 2023

21-24 November, 2023. Xenocs is pleased to attend the 15th Rayons X et Matière Conference from November 21-24 in Bordeaux, France. Meet us at our booth!

News Type of articles

China – Announcement of Winners for The First SAXS Prize

In a remarkable display of talent and enthusiasm, the first SAXS Prize organized in China by Xenocs and the Chinese Crystallographic Society SAXS committees, recently concluded...

Events

HeCrA 2023

20-22 October, 2023. Xenocs is pleased to attend the 11th Conference of the Hellenic Crystallographic Association (HeCrA) from October 20-22 in Larissa, Greece. Meet us at our booth!

News

BUSINESS NEWS : Xenocs acquires SAXSLAB

Sassenage, France - January 4, 2017 - Xenocs SAS and SAXSLAB Aps announce that Xenocs has acquired 100% of SAXSLAB shares in an all cash transaction. "We are very excited about this acquisition, as it will strengthen our ability to provide innovative solutions for characterisation at the nano-scale; ultimately allowing…

News

Xeuss 2.0 HR SAXS/WAXS instrument at The Pennsylvania State University

The Materials Characterization lab at the Pennsylvania State University's Materials Research Institute recently purchased a Xeuss 2.0 HR SAXS/WAXS system equipped with a Pilatus3 200K detector and SWAXS module to replace their current X-ray scattering instrument installed ten years ago. The instrument will be used to expand the characterization capabilities…

News

NEW ! Triple source for the Xeuss 2.0 at the University of Strathclyde

Xenocs is very proud to announce the sale of a Xeuss 2.0 HR SAXS/WAXS equipment to the University of Strathclyde in Glasgow. It will be the first SAXS/WAXS laboratory system in the world equipped with a Triple Source Module, which is an innovation 2016 from Xenocs. Up to now,…

News

In-situ SWAXS measurements in the lab are proving their worth

We at Xenocs see a growing interest from our user community for performing environmental studies with in-situ, simultaneous SAXS and WAXS measurements (SWAXS). Of course, synchrotron experiments are necessary for studying extremely fast dynamics (a second or less). However, a large range of useful experiments seem possible in the laboratory…

News

Xeuss 2.0 HR equipment – installation & training at Sichuan University

The Xeuss 2.0 HR SAXS/WAXS system was installed in May 2016 at the State Key Laboratory of Polymer Materials Engineering, Sichuan University, Chengdu, China. After the installation, theoretical & practical training was delivered on site. While theoretical training is open to a large number of attendees - around eighty students attended…

News

ISIS neutron source chose the Nano-inXider from Xenocs

The Nano-inXider SAXS/WAXS system from Xenocs was installed at the beginning of the month at the ISIS neutron source situated at the Rutherford Appleton Laboratory of the Science and Technology Facilities Council, Oxfordshire, UK. The equipment will be used by hundreds of users coming to ISIS to characterize their samples, which covers…

News

Switch your energy in just a few minutes with Xenocs Dual Source Module Option

SAXS/WAXS experiments can be optimized for a broad range of samples and applications with the Dual Source module option from Xenocs available in the Xeuss 2.0. The Dual Source Module Option is the capability to switch from one source to another source having a different energy, quickly and smoothly. Being…

Events

Rayons X et Matière 2023

21-24 November, 2023. Xenocs is pleased to attend the 15th Rayons X et Matière Conference from November 21-24 in Bordeaux, France. Meet us at our booth!

Events

HeCrA 2023

20-22 October, 2023. Xenocs is pleased to attend the 11th Conference of the Hellenic Crystallographic Association (HeCrA) from October 20-22 in Larissa, Greece. Meet us at our booth!

Events Type of articles

ECIS 2023

3-8 September, 2023. Xenocs is pleased to attend the 37th conference of European Colloid & Interface Society from September 3-8 in Naples, Italy. Meet us at our booth!

Events Webinar

SAXS in the Pharmaceutical Industry

Short online course
4 & 5 October 2023 14:00–16:00 CEST

Register to our interactive two-day short course focused on the benefits and use of Small Angle X-ray Scattering (SAXS) for the pharmaceutical industry.

Events Type of articles

SILS 2023

August 30 – September 1, 2023. Xenocs is pleased to attend the annual conference of the Italian Synchrotron Radiation Society (SILS) from Wednesday 30 August until Friday 1 September 2023 in Rome, Italy. Meet us at our booth!

Events

ECNP-2023

28-31 August, 2023. Xenocs is pleased to attend the 11th ECNP International Conference on Nanostructured Polymers and Nanocomposites from August 28-31 in Lodz, Poland. Meet us at our booth!

Events

IUCR 2023

22-29 August, 2023. Xenocs is pleased to attend the 26th Congress and General Assembly of the International Union of Crystallography from August 22-29, 2023 in Melbourne, Australia. Meet us at our booth!

Events

EBSA 2023

July 31 - August 4, 2023. Xenocs will attend the EBSA Congress 2023 from September 19-23 in Stockholm, Sweden. We will present a poster on "Small Angle X-ray Scattering (SAXS) as a Powerful Nano-Analytic Tool for Pharmaceutics". Let's discuss how SAXS can help your research projects!

Events

ICR 2023

July 29 - August 4, 2023. Xenocs is pleased to attend the 10th International Congress on Rheology from July 29 - August 4, 2023 in Athens, Greece. We will present a poster on "Investigating shear sensitive samples with laboratory SAXS". We will be pleased to welcome you to our booth…

Events

DXC 2023

7-11 August, 2023 Xenocs is pleased to attend the 2023 Denver X-ray Conference from August 7-11 in The Westin Chicago Lombard, Lombard, Illinois, USA. Meet us at our booth!



Source	Microfocus sealed tube: Cu, 30W/30µm, point focus. ( DIN EN 12543-5) Polychromatic Copper microfocus source for imaging a field of view of 14 mm x 14 mm. MetalJet D2+ source (Ga), 250 W Rotating anode X-ray sources (Cu and Cr/Mo/Co on demand) 1.2 / 3 kW - 70 μm Motorized Dual or Triple source (Microfocus sealed tube: Cu/Mo/Cr combined with MetalJet or Microfocus rotating anode)
Optics	Patented 3D single reflection multilayer optics.
Detector	In-vacuum motorized 3-axis detectors for 2D SAXS/WAXS (Q-Xoom): --Eiger2 R (500K, 1M or 4M) hybrid photon counting detectors Optional WAXS detectors for SWAXS: --Motorized 3-axis Eiger2 R 500K hybrid photon counting detector
Sample chamber	Large vacuum chamber. On-axis sample viewing (parallax free). Attachments for operation of sample in air. XL station: Dedicated air-space tailored for accommodating extra-large sample environments
Key features	Clean Beam technology: High flux and low background beamline. Beamstopless measurement: SAXS acquisition continuously without any beamstop. Q-Xoom: Automatic change of measurement configuration over all instrument Q-range with no movement of sample measuring position and automatic callibations. Virtual detector mode: Surfaces of detection > 200 mm x 200 mm.
Measurement capability	Nanoparticles size up to 250 nm, 500 nm or 900 nm in diameter depending on the Xeuss model. Nanoparticles size up to > 2.5 microns with optional motorized Bonse-Hart module for automatic sequential USAXS/SAXS/WAXS measurements. Nanoparticles sizes down to 50 nm can be measured using the AuX source on spot sizes of 150 microns and with measuring times in the range of a minute or less. Scattering measurements up to 2Ɵ > 70° with Q-Xoom. Qmax > 49 nm-1 The X-ray imaging option extends the range of structural information from Å to mm while the Dark-field and Phase-contrast imaging (DF-PCI) option reveals nanostructure differences, interfaces and orientation.
Sample environment	Standard holders (multi-samples): solids, capillaries, powders and gels. Flowcells for liquids: --- Low noise flowcell --- Capillary flowcell --- Automatic Sample Changer --- BioCube measuring cell with dynamic monitoring (compatible with pipetting robot) Temperature stages: --- Multi-purpose X-Ray temperature stage (-30°C to 150°C) --- High temperature sample stage (-150°C to 350°C) --- Extended high-temperature sample stage (ambient to 1000°C) Mechanical stress stages: --- Tensile Stage (0 N to 600N). --- Couette stage for shear SAXS. --- Cryo-Shear Cell (-50°C to +450°C). Humidity stage (5% to 95% humidity at temperatures ranging from 10°C to 70°C). Temperature compatible advanced GISAXS stage with incidence angle control and additional rotation for texture or in-plane scattering analysis Other sample stages available under request
Software	Comprehensive Software Suite: Xplore: command and control software for intuitive data acquisition with automatic data reduction in absolute units and live data display providing also real-time equipment monitoring and scripting capabilities from any programming language. XSACT Pro (X-ray Scattering Analysis and Calculation Tool) for data analysis and interpretation including unique modules for particle shape determination through direct modeling or AI-powered classification.
General parameters	Models & Footprint: Xeuss Pro C (1 m x 3.5 m), HR (1 m x 5 m), UHR (1 m x 8 m). Maximum power consumption: 4.8kW (single phase power)


Mirror type	Figure	Optic efficiency (calculated over mirror length for 70µm source)
Standard Montel mirrors		Eff = 42%
Xenocs FOX 3D mirrors		Eff = 62%


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 3D Cu 14-39 (♦)	0.19 x 0.19	5.4	Protein crystallography (♦) Powder diffraction
FOX 3D Cu 12-53	0.3 x 0.3	3	Protein crystallography (Long Unit Cells) Powder diffraction
FOX 3D Mo 10-31	0.13 x 0.13	4	Small molecule crystallography High pressure diffraction
FOX 3D Ag 10-30	0.13 x 0.13	3	Small molecule crystallography High pressure diffraction
FOX 3D Cr 8-30	0.20 x 0.20	6	Protein crystallography (S-SAD) Stress analysis
FOX 1D Cu 12-53	0.3	3	XRD, Powder Diffraction


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 2D Mo 25-25 (♦)	0.08 x 0.08	5	Small mollecule crystallography High pressure crystallography
FOX 2D Cu 25-25 (♦)	0.08 x 0.08	5.3	Protein crystallography (♦) Micro Diffraction, Reflectometry
FOX 3D Cu 21-21 HC (♦)	0.08 x 0.08	70 x 35	Rapid x-ray Reflectometry (full beam) Scanning x-ray Reflectometry (with slit) Micro-XRF
FOX 3D Cu 28-10	0.04 x 0.04	17	Stress Analysis, Micro-diffraction, Micro-XRF
FOX 3D Cr 30-8	0.04 x 0.04	17	Stress Analysis, Micro-diffraction, Micro-XRF


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 2D Cu 12-INF (♦)	1.2 x 1.2	1	Small angle x-ray scattering (♦) High resolution x-ray diffraction (♦) Surface scattering (♦) Thin film analysis (reflectometry stress) (♦) Microdiffraction on synchrotron (♦)
FOX 2D Mo 25-INF (♦)	0.85 x 1.3	0.5	Small angle x-ray scattering High resolution x-ray diffraction Surface scattering
FOX 2D 12-60 L (♦)	0.18 x 0.2	0.5 x 2	High resolution diffraction Small sample analysis
FOX 1D Cu 12-INF (♦)	1.2	0.8	High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering


Model	Beam size at focus (µm)	Divergence (mrad)	Flux (ph/sec)	Typical application
GeniX 3D Cu High Flux *	< 190	6	> 400 x 10⁶	Protein crystallography Micro stress analysis Powder diffraction
GeniX 3D Mo High Flux	< 130	5	> 25 x 10⁶	Small Molecule crystallography High pressure
GeniX 3D Cr High Flux	< 190	6	> 300 x 10⁶	Stress Analysis
GeniX 3D Cu High Convergence *	60	70 x 35	> 400 x 10⁶	Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film
GeniX 3D Cu Low Convergence *	< 250	3	> 120 x 10⁶	Small Angle X-ray Scattering Protein Crystallography


Model	Detailed specifications
Synchrotron scatterless slits (♦)	Please contact us for any technical information Discover what our customers say about it!
X-ray alignment camera (♦)	Please contact us for any technical information
Pin Diode detector (♦)	Please contact us for any technical information
Beam stop with integrated Pin Diode	Please contact us for any technical information


BioXolver configurations	BioXolver	BioXolver L
Utilisation	Research on biological macro-molecules in solution	Research on biological macro-molecules, including large complexes and interactions
X-ray source	Microfocus GeniX 3D, MetalJet, add-on to RAG	0.02-0.3nm
Optic	Aspheric single reflection multilayer optic
Collimation	Motorized scatterless point collimation	variable
Sample cell	Xenocs thermalized BioCube flow-cell with camera and pump
Sample handling	Pipetting robot with disposable tips
Sample capacity	Up to 2 x 96 well plates (thermalized)
Minimum sample volume	Down to 5 μL
Cleaning	Automated cleaning and drying with three cleaning fluids
Detector	Dectris in-vacuum hybrid pixel photon counting detector
Detector configuration	Fixed detector distance	Variable detector distance
Data reduction and analysis software	RAW and ATSAS
Q-range and typical protein size*	0.006 Å-1 / MW < 200 MDa / Rg < 135 Å	0.003 Å-1 / MW < 1.5 GDa / Rg < 270 Å
Overall length	3.2 m (2.7 m as add-on to existing source)	4.2 m
Options	UV-Vis, separate temperature control for sample trays and BioCube	UV-Vis, separate temperature control for sample trays and BioCube
Services	Installation, training, hot-line, maintenance contract	Installation, training, hot-line, maintenance contract



Source and optics	Microfocus sealed tube: Cu, 30W/30µm, point focus. ( DIN EN 12543-5) Patented 2D single reflection multilayer optics.
Detector	Dectris Pilatus 3 hybrid photon counting detectors. Two fixed detectors for continuously and simultaneously. SAXS and WAXS acquisition up to 2θ=60°.
Beam Path	Windowless beam path entirely under vacuum from beam delivery system to detector sensor
Key features	Clean Beam technology: high flux and low background beamline. Beamstopless measurement: SAXS acquisition continuously without any beamstop. Virtual detector mode: > 200° azimuth coverage with rotation of sample.
Measurement capability	Nanoparticles size up to 250 nm in diameter.
Sample environment	Standard holders: solids, capillaries, powders. Sample holders for powders and gels. Flow cells for liquids: --- Low noise flow cell --- Capillary flow cell Automatic Sample Changer Temperature stages: --- Multi-purpose X-Ray Temperature Stage (-20°C to 150°C) --- High temperature sample stage (-150°C to 350°C) --- Extended high temperature sample stage (amb - 700°C) Tensile Stage (0-200N). GiSAXS stage compatible with high temperature sample stage. Custom stages on request.
Software	Acquisition software with automatic data reduction in absolute units and live data display. XSACT (X-ray Scattering Analysis and Calculation Tool) for data analysis and interpretation.
General parameters	Fooprint: < 1x1 m². Weight: ~ 520 kg. Maximum power consumption: < 2000 W (single phase power). Self-contained: no external fluids required.
Warranty	Two years warranty and three years on X ray source.


Element of interest	Reference
O, F, Na, Mg, Al, Si, P, S	XAN-1
Nitrogen	XAN-2
Carbon	XAN-3
Boron	XAN-4
Mg, Al , Si	XAN-5
Be	XAN-6

Useful links

X-ray Optics

Xenocs proposes a wide range of optics for both XRD and XRF applications.

2D-3D Beam shaping X-ray Optics

High Flux Optics

Small Spot Optics

Collimating Optics

1D Beam shaping X-ray Optics

High Flux Optics

Collimating Optics

X-ray beam delivery system

The combination of an innovative design and the FOX3D single reflection optics makes the GeniX3D a unique solution on the market.

High flux solutions

Small spot solutions

X-ray beam accessories

In addition to our high quality optical components and beam delivery systems, we propose accessories to optimize the performance of your setup.

Xeuss 3.0 specifications

Plenty of space for sample environment

With its large chamber and concept ensuring stationary sample during measurement, the Xeuss 3.0 is the perfect X-ray scattering platform instrument for now and the future.

Ultimate performance

The Xeuss 3.0 offers a maximum flexibility of measurement configurations to get the best possible data quality on any type of sample.

Xeuss 3.0 shown with Q-Xoom transparency to illustrate the moving detector.

Maximum flexibility

Provide structural tools to a large community of users with full remote operation capability and access to a unique range of length-scales.

Q-Xoom – enjoy the flexibility of full-range computer-controlled detector travel

Measure probe lengths as large as 4.5 microns together with nanoscale information

Optimize your experiment to any type of sample (absorption, fluorescence, characteristic dimensions)

Simultaneously from atomic to nanoscale

No need to repeat SAXS and WAXS measurement, you get two measurements within one exposure.

Extensive and powerful suite of data analysis algorithms

XSACT includes an extensive array of analysis modules for sample characterization of size, structure and texture of multiple types of materials including nanoparticles and polymers.

Low cost of ownership

Get nanoscale information on a day to day basis to improve your material process or validate your research models.

Accurate and high dynamic range measurement

Focus your attention on science and data interpretation, you can rely on your data.

Publication quality figure presentation

XSACT is a time saver as it bundles all the tools to create publication-ready figures without the need for another visualization software.

High quality SAXS data in the lab

Measurements previously only possible at synchrotron facilities can now be done in the lab.

High throughput measurements and results

Full automation from sample to final results on up to 192 samples.

In-line SEC and UV-Vis combined with SAXS – also in the lab!

Obtain the structure of small and large protein species through in-line gel filtration

BioXolver specifications

*Theoretical limit assuming globular proteins

智能工作流程和用户体验

使用XSACT可使用户用最小投入获得数据解析结果。

样品 – 测试 – 分析 – 报告 – 节约时间

智能工作流程和用户体验

使用XSACT可使用户用最小投入获得数据解析结果。

样品 – 测试 – 分析 – 报告 – 节约时间

在实验室中得到高质量SAXS数据

以前的测试只能在同步辐射完成，现在也可在实验室中实现。

SAXS可以和在线SEC、UV-Vis联用 – 在实验室也可以实现!

通过内置胶体过滤获取不同尺寸蛋白质种类的结构

低样品消耗量

低至5μL。目前是市场上最低的样品消耗量。

内容广泛、性能强大的数据分析算法软件

XSACT包括一系列的广泛的分析模块，用于对多种类型的材料包括纳米颗粒和聚合物的尺寸、结构和织构进行样品表征等。

同时从原子级别到纳米尺寸

无需重复SAXS和WAXS测试，您可以在一次曝光内同时得到所有测量结果。

高精度高动态范围测量

获取可信赖的数据，将您的注意力集中在科学和数据解释上。

更高的灵活性

为广大用户群体提供全远程自动操作的、具备表征超大纳米尺度范围的独特工具。

Q-Xoom–享受全范围计算机控制探测器行程的灵活性

测量尺度可达4.5微米，并获取纳米尺度信息

对任何种类样品(吸收，荧光，特征尺寸)的实验进行优化

高性能

Xeuss 3.0实验装置具备最大的灵活性，用于测试各种样品并尽可能获取最佳质量的数据。