Surface Structure And Patterns

X-ray beam delivery system

The combination of an innovative design and the FOX3D single reflection optics makes the GeniX3D a unique solution on the market.

Sealed tube micro sources are becoming a standard in x-ray analytical equipments as they provide high useful flux in a low cost of ownership, eco friendly package. Based on this technology, Xenocs has developed a high performance x-ray beam delivery system: the GeniX3D.

The combination of an innovative design and the FOX3D single reflection optics makes the GeniX3D a unique solution on the market. The GeniX3D stands out for its beam intensity, definition and stability, its ease of integration and reliability.

The GeniX3D comes in different energies and beam geometry to cover a large range of applications.

Thanks to its unique performance, ergonomics and reliability, the GeniX3D has become the reference among the leading Original Equipment Manufacturers of X-ray analytical equipments.

Video: GeniX3D, X-ray beam delivery system

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Our product range

High flux solutions


Model	Beam size at focus (µm)	Divergence (mrad)	Flux (ph/sec)	Typical application
GeniX 3D Cu High Flux *	< 190	6	> 400 x 10⁶	Protein crystallography Micro stress analysis Powder diffraction
GeniX 3D Mo High Flux	< 130	5	> 25 x 10⁶	Small Molecule crystallography High pressure
GeniX 3D Cr High Flux	< 190	6	> 300 x 10⁶	Stress Analysis
GeniX 3D Cu High Convergence *	60	70 x 35	> 400 x 10⁶	Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film
GeniX 3D Cu Low Convergence *	< 250	3	> 120 x 10⁶	Small Angle X-ray Scattering Protein Crystallography

* Configurations also available for low energy radiation (V, Cr)

Small spot solutions


Model	Beam size at focus (µm)	Divergence (mrad)	Flux (ph/sec)	Typical application
GeniX 3D Cr Micro Spot	< 30	17	> 12 x 10⁶	Stress Analysis Micro-XRF Micro-XRD
GeniX 3D Cu Micro Spot	< 30	17	> 18 x 10⁶	Stress Analysis Micro-XRF Micro-XRD
GeniX 3D Mo Micro Spot	< 55	10	> 1.8 x 10⁶	Micro-XRF Micro-XRD
GeniX 3D Cu High Convergence *	60	70 x 35	> 400 x 10⁶	Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film

* Configurations also available for low energy radiation (V, Cr)

Plenty of space for sample environment

With its large chamber and concept ensuring stationary sample during measurement, the Xeuss 3.0 is the perfect X-ray scattering platform instrument for now and the future.

Advanced materials research and characterization could require integration of specific or customized sample environments.
Xeuss 3.0 is perfectly adapted for such new projects thanks to its state of the art beamline concept.
It provides:

Large vacuum chamber with stationary sample during measurement (continuous on-axis sample viewing, smart integration of customized sample environments)
Sample stage with long translations for sample mapping and batch measurements
Broad range of standard sample environments with holder recognition

Ultimate performance

The Xeuss 3.0 offers a maximum flexibility of measurement configurations to get the best possible data quality on any type of sample.

In particular, the following key features enable the user to optimize experiments or results:

High flux settings adapted for fast kinetics embedded in a low background camera
Largest surface of detection moveable all the way from WAXS to long distance SAXS to optimize resolution and signal-to-noise
Long distance SAXS settings for measuring large characteristic dimensions (> 300 nm)
Optional USAXS module to characterize large structures ( > 4 µm)

Xeuss 3.0 shown with Q-Xoom transparency to illustrate the moving detector.

Beamstopless data acquisition

SAXS acquisition continuously without any beamstop provides High Dynamic Range data.

No parasitic scattering from beamstop edges or detector window allows noise-free scattering at low q.

The direct beam is recorded simultaneously with the sample scattering profile during acquisition for accurate transmitted intensity measurement, used to obtain a precise absolute intensity normalization.

In addition, the direct beam profile thus measured is integrated in the data analysis (XSACT) to improve the accuracy of the results.

Clean Beam Technology

As a standard solution, Xeuss 3.0 integrates low maintenance microfocus beam delivery systems to provide very high flux levels previously only possible with high power rotating anode sources.
Advanced experiments such as kinetic studies or shape analysis of diluted samples can now be performed in the lab.

In addition, Xenocs X-ray beam delivery systems coupled with motorized scatterless collimation achieve high resolution (low Δq beam), which is essential for studying large characteristic dimensions or for performing accurate mesophase analysis.

The high useful flux together with the high resolution capability are achieved through the combination of:

High brightness, long lasting microfocus sources
Patented single reflection 2D multilayer optics with very high solid angle of collection
2D controlled beam size on sample and detector

To ensure the best quality of X-ray scattering measurements, including on diluted or low contrast samples, Xeuss 3.0 combines high flux with low noise technology, which is the fruit of more than 10 years of development.

Key integrated features are:

Fully in-vacuum system from optics to detector sensor
3rd generation scatterless collimation (first introduced on the market by Xenocs in 2008)
In-vacuum windowless detector
Hybrid pixel photon counting detector
Proprietary automatic cosmic background reduction to reduce the impact of ambient parasitic scattering

For applications requiring very fast kinetics Xeuss 3.0 can also be delivered with a MetalJet source.

Q-Xoom with large surface of detection

The Q-Xoom features full range computer-controlled detector travel to automatically adjust the sample-to-detector distance offering maximum flexibility of measurement for experiment optimization.

The virtual detector increases the measuring capabilities offering surfaces of collection larger than 200 mm² x 200 mm² at any sample-to-detector distance independently of detector size with automatic data reconstruction.

The large surface of detection is beneficial to optimize the azimuthal coverage in case of anisotropic samples or to benefit from high resolution measurement settings by characterizing smaller length scales (larger wave vectors) at longer sample to detector distance by a detector offset.

Maximum flexibility

Provide structural tools to a large community of users with full remote operation capability and access to a unique range of length-scales.

Advanced nanomaterials development and design require characterization over a large range of length scales. The Xeuss 3.0 offers such measuring capability over up to 5 orders in magnitude in q (wave vector) through entirely motorized change of configurations. Any trained user can thus operate the system remotely over its complete measurement range for a given sample or batch of samples.

Automatic change of measuring settings include:

– Q-Xoom change of measurement resolution through motorized translation of detector
– Sequential SAXS /USAXS measurement with Bonse-Hart USAXS module
– Change of energy radiation, up to 3 energies
– Movable WAXS detector for out of equilibrium in situ SWAXS studies

Q-Xoom in-vacuum moving detector

Q-Xoom – enjoy the flexibility of full-range computer-controlled detector travel

Access unique performance with all configurations for SAXS and WAXS with detector travel from 1 to 4 m (depending on version) in vacuum
Virtual detector for a surface of detection larger than 200 x 200 mm²
Full remote operation with live data display (2D & 1D) during experiment: reduce downtime, optimize your experiments
Leave your sample in one position with room for sample environment
Measure in vacuum with clean-beam windowless detector or in air with X-Cones

Motorized Bonse-Hart USAXS module

Measure probe lengths as large as 4.5 microns together with nanoscale information

In & out removable crystals ensure USAXS and SAXS automatic sequential acquisitions on the same sample
High quality SAXS & USAXS data merging
No need for manual handling or instrument reconfiguration
USAXS and SAXS/WAXS incident beams are colinear – no need to move the sample

Multi-energy source

Optimize your experiment to any type of sample (absorption, fluorescence, characteristic dimensions)

Motorized change of source with automatic instrument alignment
Up to 3 sources modules (Cu, Mo, Cr). Can be integrated with Ga MetalJet source.
High precision switch process enables sequential measurement on same sample with different source radiation

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Simultaneously from atomic to nanoscale

No need to repeat SAXS and WAXS measurement, you get two measurements within one exposure.

The Nano-inXider features a smart dual detector design to detect atomic scale information and nanostructure simultaneously within one exposure. Long sample-to-detector distance for measuring large characteristic dimensions is achieved in SAXS through a vertical design with a small footprint.

Such configuration provides unique benefits:

You get access to nanostructure information together with atomic scale information in a single exposure. No need to repeat the experiment.
Unambiguous data is provided for inhomogenous samples since the same volume of sample is analyzed in SAXS and WAXS
Sample structure is probed at the same exact time at both atomic and nanoscale, which is mandatory for in situ studies

Dual fixed detector design for simultaneous SAXS and WAXS

With the Nano-inXider, the sample and the detectors are fixed. The optional WAXS detector extends the scattering range from the SAXS detector seamlessly throught 2Ɵ=60°.

Such a unique vertical design provides unique benefits:

No risk to choose the wrong configuration, it really is easy to use.
You get full q range with overlap between SAXS and WAXS, and a perfect intensity match of merged data.
No need to calibrate or adjust the sample-to-detector distance.
Unambiguous data is collected for in situ studies as atomic scale and nano scale structures are probed simultaneously.

Virtual detector for increased azimuthal coverage of anisotropic samples or fibers

For anisotropic samples like fibers or oriented films, the Nano-inXider is equipped with a sample rotation stage that acquires the anisotropic scattering. The automatic acquisition involves the following steps:

Rotation of the sample stage around the X-ray beam during sequential exposures
Automatic merge of the acquired images
Display of the final 2D image with a high azimuthal coverage (>200° over all instrument q range, i.e. up to 2Ɵ = 60°)

Extensive and powerful suite of data analysis algorithms

XSACT includes an extensive array of analysis modules for sample characterization of size, structure and texture of multiple types of materials including nanoparticles and polymers.

The SAXS community relies on multiple algorithms with custom models and many different applications. XSACT offers a unified, versatile and complete data processing solution to get things done as fast as possible.

Unique capability for particle sizing
Measurement data simulator

X-ray Optics

Xenocs proposes a wide range of optics for both XRD and XRF applications.

Based on worldwide patents and more than 14 years of Research and Development, Xenocs is the only company in the world proposing single reflection multilayer optics. These optics offer typically 50% more efficiency than standard multiple reflection optics, also called Montel optics.

Based on its proprietary replication technology, Xenocs is able to offer innovative optical designs with unmatched performance, which up to now have been impossible to achieve with other existing manufacturing techniques.


Mirror type	Figure	Optic efficiency (calculated over mirror length for 70µm source)
Standard Montel mirrors		Eff = 42%
Xenocs FOX 3D mirrors		Eff = 62%

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Our product range for XRD application

2D-3D Beam shaping X-ray Optics

High Flux Optics


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 3D Cu 14-39 (♦)	0.19 x 0.19	5.4	Protein crystallography (♦) Powder diffraction
FOX 3D Cu 12-53	0.3 x 0.3	3	Protein crystallography (Long Unit Cells) Powder diffraction
FOX 3D Mo 10-31	0.13 x 0.13	4	Small molecule crystallography High pressure diffraction
FOX 3D Ag 10-30	0.13 x 0.13	3	Small molecule crystallography High pressure diffraction
FOX 3D Cr 8-30	0.20 x 0.20	6	Protein crystallography (S-SAD) Stress analysis
FOX 1D Cu 12-53	0.3	3	XRD, Powder Diffraction

Small Spot Optics


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 2D Mo 25-25 (♦)	0.08 x 0.08	5	Small mollecule crystallography High pressure crystallography
FOX 2D Cu 25-25 (♦)	0.08 x 0.08	5.3	Protein crystallography (♦) Micro Diffraction, Reflectometry
FOX 3D Cu 21-21 HC (♦)	0.08 x 0.08	70 x 35	Rapid x-ray Reflectometry (full beam) Scanning x-ray Reflectometry (with slit) Micro-XRF
FOX 3D Cu 28-10	0.04 x 0.04	17	Stress Analysis, Micro-diffraction, Micro-XRF
FOX 3D Cr 30-8	0.04 x 0.04	17	Stress Analysis, Micro-diffraction, Micro-XRF

Collimating Optics


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 2D Cu 12-INF (♦)	1.2 x 1.2	1	Small angle x-ray scattering (♦) High resolution x-ray diffraction (♦) Surface scattering (♦) Thin film analysis (reflectometry stress) (♦) Microdiffraction on synchrotron (♦)
FOX 2D Mo 25-INF (♦)	0.85 x 1.3	0.5	Small angle x-ray scattering High resolution x-ray diffraction Surface scattering
FOX 2D 12-60 L (♦)	0.18 x 0.2	0.5 x 2	High resolution diffraction Small sample analysis
FOX 1D Cu 12-INF (♦)	1.2	0.8	High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering

1D Beam shaping X-ray Optics

High Flux Optics


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 1D Cu 12-53	0.3	3	XRD, Powder Diffraction

Collimating Optics


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 1D Cu 12-INF (♦)	1.2	0.8	High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering

Our product range for XRF application

Based on its extended experience in multilayer coatings, surface shaping, and advanced metrology, Xenocs has developed a broad range of high performance XRF analyzer optics.

With its unique replication technology, Xenocs has developed new analyzer geometries that lead to improved lower limits of detection and increased measurement throughput.

XRF Optics


Element of interest	Reference
O, F, Na, Mg, Al, Si, P, S	XAN-1
Nitrogen	XAN-2
Carbon	XAN-3
Boron	XAN-4
Mg, Al , Si	XAN-5
Be	XAN-6

Low cost of ownership

Get nanoscale information on a day to day basis to improve your material process or validate your research models.

High return on investment
Will easily find a place in your lab with its vertical design
Easy access for technicians
Daily use with high throughput
Low environment impact

The low cost of ownership of the Nano-inXider mainly comes from its compactness and low cost of operation

Compact instrument

Fooprint < 1×1 m²
Weight ≈ 520 kg
Self-contained
Easy mounting over the horizontal samples

Low operating cost

Low mean power consumption ≈ 700 W
Two years warranty on the equipment
Maintenance free source with three years warranty
Simple and robust

Accurate and high dynamic range measurement

Focus your attention on science and data interpretation, you can rely on your data.

The Nano-inXider acquires high signal to noise data by measuring the intense direct beam transmitted through the sample together with low intensity signal scattered from the sample.
Direct beam measurement, achieved with innovative beamstop-less data acquisition, enables automatic data treatment and display in absolute intensity with a very high accuracy.
Simultaneous low intensity signals detection is rendered possible by implementation of Clean Beam Technology.

The high dynamic range of intensity collection directly impacts data quality by:

– Enabling the detection of low intensity scattered signal from weakly scattering samples
– Accessing absolute quantity parameters such as particles number, molar mass, concentration, specific surface
– Detecting large characteristic dimensions without need of user data treatment

Clean Beam Technology for high dynamic range measurement

The Nano-inXider integrates 15 years of R&D in the field of advanced components and instrument design to achieve an optimized balance of high X-ray flux on sample together with low parasitic scattering generated by the instrument.

Clean Beam Technology embeds the following key components and features:

Microfocus sealed tube source (30 W) coupled to patented single reflection multilayer optics
Patented motorized scatterless collimation
Fully in vacuum instrument from optics to detector sensor
Efficient and low noise hybrid pixel photon counting detector
Windowless SAXS detector

Beamstop-less acquisition for high-quality data

The Nano-inXider measures SAXS without any beamstop and simultaneously collects the direct beam transmitted through the sample together with the scattered signal down to very low intensity levels.

Such high dynamic range data collection is rendered possible by innovative beamstop-less data acquisition.

The direct beam is recorded all along the acquisition, which leads to an accurate transmitted measurement used to obtain a precise absolute intensity normalization.

In addition, the measured direct beam profile (resolution function) is integrated in the data analysis to improve results quality.

Xenocs beamstop-less data acquisition integrates automatic qmin determination depending on the sample and benefits from no parasitic scattering from beamstop edges for high data quality at low q.

Cosmic background reduction

Automatic cosmic background removal reduces the impact of ambient parasitic scattering.

Publication quality figure presentation

XSACT is a time saver as it bundles all the tools to create publication-ready figures without the need for another visualization software.

For the best understanding of output data, a scientist must have the tools to visualize, exchange and compare numerous graphical representations.
By combining data processing with advanced visualization capabilities, XSACT speeds up your workflow from acquisition to publication.

Highly customizable data visualization
Easy export in multiple formats
High quality with vector graphics

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High quality SAXS data in the lab

Measurements previously only possible at synchrotron facilities can now be done in the lab.

With the BioXolver you get:

Excellent data suitable for modelling and publications.
Precision determination of key structural parameters.
Structural information of proteins in solutions on a daily basis as complementary information to other characterization techniques.

Due to weak scattering from biological samples, high quality SAXS measurements require an instrument optimized for maximum X-ray intensity and lowest possible background noise. The BioXolver offers a unique combination of both capability in particular with:

High brightness sources coupled to latest generation 2D multilayer optics.
In-vacuum photon counting detectors with beamstop-less data acquisition.
Clean Beam Technology reducing parasitic scattering to its lowest levels.

High brightness sources coupled to high quality optics

The BioXolver can be installed with different source options.

It can integrate a MetalJet source to obtain the highest X-ray beam intensity possible in a laboratory instrument.

It can also be installed with the Genix3D, a bright microfocus low maintenance source with intensity levels only previously accessible with high power rotating anode sources. Such performance is achieved by combining the Genix3D long lasting source with new patented FOX 3D multilayer optics having a very high solid angle.

Beamstop-less acquisition with windowless detectors

The BioXolver comes with windowless hybrid photon counting (HPC) detectors which allows for beamstopless measurements.

By operating without beamstop the direct beam is recorded all along the acquisition, which leads to an accurate transmission measurement used to obtain a precise absolute intensity normalization.

Moreover, operating without beamstop reduces the lowest scattering angle achievable as it is no more limited by beamstop size but is sample dependent.

Clean Beam Technology

The BioXolver uses state of the art collimation slits that greatly reduce noise and provide a clean beam.

High quality detection is achieved with hybrid photon counting (HPC) detectors integrated inside vacuum with no interfering window in front of detector sensor (windowless detector). This ensures that weakly scattering samples can also be measured at low concentrations.

Overall measuring background level of the instrument is further improved by proprietary automatic cosmic background removal algorithms suppressing high energy cosmics hitting the detector.

High throughput measurements and results

Full automation from sample to final results on up to 192 samples.

With the BioXolver standard well plates can be loaded & measured automatically using in-line pipetting robot & automated software suite for high user benefits.

More samples can be run
Short sample-to-sample cycle time
Reproducibility of your measurement is insured

Sample loading robot

The advanced pipetting robot avoids cross-contamination of samples through the use of disposable pipette tips, tubeless handling for no sample loss and a fully automated sample cell cleaning and drying.

Automated software package for data analysis

The BioXolver includes powerful data reduction BioXTAS RAW widely used by the BioSAXS community.

It enables standard data operation and data analysis (Rg, molecular weight, etc.), together with advanced analysis using ATSAS plugins.

For high throughput analysis, the automated analysis function analyzes and compiles the results for you.

Read application note

In-line SEC and UV-Vis combined with SAXS – also in the lab!

Obtain the structure of small and large protein species through in-line gel filtration

Sample size separation using size-exclusion chromatography in combination with the BioXolver can not only be used to ensure clean monodisperse samples, but also facilitates research on structurally heterogeneous & aggregation-prone multi-domain proteins as well as heterogeneous protein complexes in dynamic equilibria.

Easy switching to SEC-SAXS experiments

The BioXolver will work with any HPLC system, simply position the HPLC next to the instrument and hook up the column to the BioCUBE flow cell. The in-line UV/Vis ensures accurate determination of the sample concentration exactly at the SAXS exposure position. The included analysis software automatically reduces and provides an easy overview of your entire SEC-SAXS run and makes further analysis easy.

Integrated UV-Vis

In situ UV measurement directly in the measurement cell provides concentration information of the sample before and after X-ray exposure or during a SEC-SAXS experiment.

This is especially important in this case as the sample is diluted in the transport path from the (HPLC) column exit to the x-ray exposure position.

BioXolver specifications


BioXolver configurations	BioXolver	BioXolver L
Utilisation	Research on biological macro-molecules in solution	Research on biological macro-molecules, including large complexes and interactions
X-ray source	Microfocus GeniX 3D, MetalJet, add-on to RAG	0.02-0.3nm
Optic	Aspheric single reflection multilayer optic
Collimation	Motorized scatterless point collimation	variable
Sample cell	Xenocs thermalized BioCube flow-cell with camera and pump
Sample handling	Pipetting robot with disposable tips
Sample capacity	Up to 2 x 96 well plates (thermalized)
Minimum sample volume	Down to 5 μL
Cleaning	Automated cleaning and drying with three cleaning fluids
Detector	Dectris in-vacuum hybrid pixel photon counting detector
Detector configuration	Fixed detector distance	Variable detector distance
Data reduction and analysis software	RAW and ATSAS
Q-range and typical protein size*	0.006 Å-1 / MW < 200 MDa / Rg < 135 Å	0.003 Å-1 / MW < 1.5 GDa / Rg < 270 Å
Overall length	3.2 m (2.7 m as add-on to existing source)	4.2 m
Options	UV-Vis, separate temperature control for sample trays and BioCube	UV-Vis, separate temperature control for sample trays and BioCube
Services	Installation, training, hot-line, maintenance contract	Installation, training, hot-line, maintenance contract

*Theoretical limit assuming globular proteins

智能工作流程和用户体验

使用XSACT可使用户用最小投入获得数据解析结果。

XSACT的智能化设计为您带来了简单的工作流程，并通过强大的图形交互功能帮助您获得结果。

数据处理快
简单易用
既可被初学者使用, 也可被专家使用

了解更多智能化功能

样品 – 测试 – 分析 – 报告 – 节约时间

根据采集条件轻松绘制出数据结果
完全格式化自动生成的报告
适用于Windows/Linux的跨平台软件

联系我们看动态演示

智能工作流程和用户体验

使用XSACT可使用户用最小投入获得数据解析结果。

XSACT的智能化设计为您带来了简单的工作流程，并通过强大的图形交互功能帮助您获得结果。

数据处理快
简单易用
既可被初学者使用, 也可被专家使用

了解更多智能化功能

样品 – 测试 – 分析 – 报告 – 节约时间

根据采集条件轻松绘制出数据结果
完全格式化自动生成的报告
适用于Windows/Linux的跨平台软件

联系我们看动态演示

在实验室中得到高质量SAXS数据

以前的测试只能在同步辐射完成，现在也可在实验室中实现。

通过BioXolver，您可以得到：

适用于建模和发表文章的高质量数据
精确测定关键结构参数
日常得到的在溶液中的蛋白质结构信息，可作为其他表征技术的补充信息

由于生物样品的微弱散射，高质量的SAXS测量需要一台仪器来达到最大X射线强度和尽可能低的背景噪音。通过以下技术的组合，BioXolver具备了这两种独特的功能:

高亮度光源结合最新一代二维多层膜光学聚焦镜
在真空中运行的无beamstop数据采集的光子计数探测器
纯净光束技术将寄生散射降低到最低水平

高亮度光源与高质量光学聚焦镜相结合

BioXolver可以配备不同的光源。

可以结合MetalJet光源，在实验室仪器中获得尽可能高的X射线光束强度。

也可以安装Genix3D，一种低维护成本的高亮度微聚焦光源，其强度以前只有高功率阳极转靶才能达到。这种性能通过结合Genix3D耐用光源与具有超高立体角、新的专利FOX 3D多层膜聚焦镜实现。

通过无窗口膜探测器实现无beamstop测试

BioXolver配备了无窗口膜混合光子（HPC）探测器，能够实现无beamstop测试。

在无beamstop情况下，整个测试过程中一直记录直通光，通过准确的透射测试来得到准确的绝对强度校正。

此外，由于不受beamstop尺寸限制，而只与样品有关，无beamstp测试可得到更小的最小散射角度。

纯净光技术

BioXolver采用了最先进的准直狭缝，极大地降低了噪音，从而得到了纯净光束。

通过在真空中利用混合光子计数（HPC）探测器，且探测器传感器（无窗口膜探测器）前面无干扰，实现了高质量的检测。这可确保弱散射样品也可以在低浓度下测量。

采用专用的宇宙背景自动去除法，抑制高能宇宙射线，进一步降低了仪器整体的背景噪音。

SAXS可以和在线SEC、UV-Vis联用 – 在实验室也可以实现!

通过内置胶体过滤获取不同尺寸蛋白质种类的结构

BioXolver结合了尺寸排阻色谱法来进行区别样品大小，不仅可以保证样品完全单分散，还能促进对结构异质且易于聚集的多域蛋白以及动态平衡中异质蛋白复合物的研究。

轻松切换到SEC-SAXS实验

BioXolver适用于任何HPLC系统，只需将HPLC置于仪器旁边，并将色谱柱连接到BioCUBE流动池。在线UV/Vis能够确保在SAXS曝光位置精确测量样品浓度。自带的分析软件可自动简化概述整个SEC-SAXS运行过程，这使得进一步分析更加容易。

集成UV-Vis

由于原位UV测试直接在测试池进行，在X射线曝光之前和之后或在SEC-SAXS测试中都能得到样品的浓度信息。

因为样品在从(HPLC)柱出口到X射线曝光位置的传输过程中会被稀释，所以在这种情况下，这一点尤为重要。

低样品消耗量

低至5μL。目前是市场上最低的样品消耗量。

通过内置移液机械臂，毛细管流动池BioCUBE以及机械视觉的结合对样品进行监测，确保了少量样品的高精度定位。

在不同环境或浓度下样品总消耗低，对生物结构研究非常有益。

需要极少的宝贵样品。
在相同的样品制备量下可以进行更多的实验。

BioCUBE

无管操作确保样品消耗量低至5 μl。这在同类仪器中是独一无二的。

每个样品首先由无管移液机械臂自动注入到BioCUBE测量池中，然后定位到光束中进行测量，并实时对其位置进行连续控制。

样品在孔盘中储存期间和在BioCUBE测试期间都始终保持在选定的温度下。

您还可以选择具有集成UV/Vis功能的BioCUBE。

5μl样品量的机械视觉控制

利用机械视觉技术，BioXolver能够随时对样品进行数字化监控。

样品装载后就会被准确地定位在X射线光束中，同时持续反馈结果给自动控制软件来保持光束中的样品量不变。

内容广泛、性能强大的数据分析算法软件

XSACT包括一系列的广泛的分析模块，用于对多种类型的材料包括纳米颗粒和聚合物的尺寸、结构和织构进行样品表征等。

SAXS用户群倾向于具有自定义模型和多种不同应用程序的算法。XSACT提供的统一、全面且完整的数据处理解决方案可尽快完成任务。

具有独特的粒径分析功能
测量数据模拟器

了解更多关于粒径分析的独特功能的信息

Xenocs的专属解决方案是基于EM算法
用无参数法来获取粒子系统的尺寸分布
高功能处理具有统计不确定性的数据

了解更多XSACT数据模拟的功能

调节样品或仪器的性能来模拟散射强度
估量由仪器分辨率的不同设置引起的模糊效应

联系我们看动态演示

同时从原子级别到纳米尺寸

无需重复SAXS和WAXS测试，您可以在一次曝光内同时得到所有测量结果。

Nano-inXider独特的智能化双探测器设计，可以在一次曝光内同时检测到原子尺度信息和纳米结构。设备占地面积小的垂直设计，样品到探测器距离长，可以测量大的特征尺寸。

这些配置可以提供以下独特的优势：

您可以在一次曝光内获得纳米结构信息和原子尺度信息。无需重复实验。
由于在SAXS和WAXS中分析的是相同体积的样品，因此对于非均匀样品也能获得明确的数据。
在原子和纳米尺度上探测样品结构是完全同步的，这对于原位研究是必要的。

双固定探测器设计便于同时进行SAXS和WAXS测量

Nano-inXider的样品和探测器都是固定的。可选的WAXS探测器配置扩大了散射范围，可以无缝衔接SAXS探测器，得到的数据达到2θ=60°。

这独特的垂直设计有以下优势：

杜绝配置选错的可能，真正的易于操作。
SAXS和WAXS数据部分重叠，获取完整q值范围内强度完美匹配的合并数据。
无需校准或调整样品到探测器距离。
同时对原子尺度和纳米尺度结构进行了探测，可以为原位研究提供清晰的数据。

虚拟探测器能够增大各向异性样品或纤维的方位角覆盖

对于纤维或取向薄膜等各向异性样品，Nano-inXider配备一个样品旋转台可以获得各向异性散射信号。自动采集包括以下步骤:

在连续曝光期间，样品台围绕X射线旋转
自动合并获得的图像
展示高方位角的2D图谱（仪器检测的所有q范围，即使高达2θ=60°，方位角覆盖都大于200°）

高精度高动态范围测量

获取可信赖的数据，将您的注意力集中在科学和数据解释上。

Nano-inXider可以通过测量透过样品的强直通光和样品的低散射强度信号来获得高信噪比数据。
通过先进的无beamstop数据采集进行直通光测量，自动处理数据并获得准确度高的绝对强度。
纯净光技术可以实现同时检测低强度信号和高强度信号。

强度采集的高动态范围直接影响数据质量：

– 能够检测弱散射样品的低强度散射信号
– 定量获得粒子数、摩尔质量、浓度、比表面积等参数
– 探测大特征尺寸，无需用户进行数据处理

纯净光技术适用于高动态范围测量

Nano-inXider通过在先进组件和仪器设计上长达15年的研发，达到了在样品上高X射线通量与仪器产生的低寄生散射的最佳平衡。

纯净光技术具有以下主要组件和特点：

微聚焦密封管光源(30W)与专利的单次反射多层膜聚焦镜结合
专利的自动无散射准直技术
仪器从聚焦镜到探测器传感层全部在真空环境中
高效低噪声混合像素光子计数探测器
无窗口膜的SAXS探测器

无beamstop采集可得到高质量数据

Nano-inXider无需任何beamstop就可以进行SAXS测量，还可以同时采集透过样品的直通光和非常低强度散射信号。

通过先进的无beamstop数据采集可实现高动态范围的数据收集。

在整个的采集过程中记录直通光，使透射测试更准确，从而使绝对散射强度校正更准确。

另外，被测量的直通光（分辨率函数）会被整合到数据分析中来提高测量结果的质量。

Xenocs无beamstop数据采集实现了取决于样品的自动q_min测量，并且消除了beamstop边缘的寄生散射，从而在低q区域获得高质量数据。

降低宇宙背景

自动去除宇宙背景可以减少环境寄生散射的影响。

更高的灵活性

为广大用户群体提供全远程自动操作的、具备表征超大纳米尺度范围的独特工具。

先进纳米材料的发展和设计需要在超大纳米尺度范围上进行表征。Xeuss 3.0具备这样的测试能力，通过完全自动改变配置，采集的散射矢量q可跨越5个数量级。因此，对于给定的单个或批量样品，任何经过培训的用户都可以在完整的测量范围内远程操作系统。

可自动更改的测量设置包括：

– Q-Xoom通过探测器沿光路的自动平移来改变测量分辨率
-使用Bonse Hart USAXS模块可以实现连续的SAXS/USAXS测量
– X光源能量可选，提供3个可选光源
– 用于原位SWAXS研究的可移动WAXS探测器

Q-Xoom在真空环境中移动探测器

Q-Xoom–享受全范围计算机控制探测器行程的灵活性

独一无二的特性：探测器在真空中沿光路自动移动1 ~ 4米（取决于所选型号）。
虚拟探测器的探测面积大于200 x 200 mm²
在实验过程中，完全远程操作和实时数据显示（二维和一维），减少了停机时间，优化您的实验过程
将样品放在固定位置为样品环境留出空间
在真空中用纯净光、无窗探测器测试或在空气中用X-Cones进行测试

自动Bonse-Hart USAXS模块

测量尺度可达4.5微米，并获取纳米尺度信息

内外移动的分析晶体可确保在同一个样品上USAXS和SAXS能够自动连续采集。
高质量SAXS和USAXS数据合并
无需人工操作或仪器重置
USAXS和SAXS/WAXS入射光在一条直线上，故无需移动样品

多种光源

对任何种类样品(吸收，荧光，特征尺寸)的实验进行优化

在自动切换光源时仪器可自动校准光路。
多达3个光源模块（Cu, Mo, Cr）可以与Ga MetalJet光源一起使用。
不同光源的高精度切换，可确保用不同波长对同一样品的连续测量。

获取用户发表的文章

高性能

Xeuss 3.0实验装置具备最大的灵活性，用于测试各种样品并尽可能获取最佳质量的数据。

尤其，以下关键特点使用户得以优化最佳的实验和结果:

高光通量设置和内置低背景无噪音探测器，适合快速动力学测试
探测器从WAXS位置自动移动到远距离的SAXS位置，且在任意位置均可探测大面积图谱，以优化分辨率和信噪比
远距离的SAXS设置可测量大特征尺寸样品 (> 300 nm)
可选的USAXS模块进行超大结构表征 ( > 4 µm)

上图显示了通过玻璃窗，可以观察到Xeuss3.0的Q-Xoom真空腔内探测器的移动。

无beamstop数据采集

无beamstop连续采集高动态范围SAXS数据。

杜绝来自Beamstop边缘或探测器窗口膜的寄生散射，使低q处的散射信号不受干扰。。

在采集过程中同时记录直通光和样品散射信号，得到精确的透射强度，用于获取精确的绝对强度校正。

另外，采集的直通光信号将整合到数据分析软件（XSACT），提高解析结果的准确性。

纯净光技术

作为一个标准的解决方案，Xeuss 3.0集成低维护成本的高性能微聚焦光源，亮度达到了之前高功率旋转阳极靶光源才能实现的水平。
现在实验室中就可进行诸如动力学研究或稀释样品的纳米粒子形状分析的高级实验。

另外，通过结合Xenocs公司的X射线光束和自动无散射准直系统实现高分辨率（光束Δq低），这对研究大特征尺寸的样品或进行准确中间相的分析都非常重要。

通过以下组合实现高光通量和高分辨率：

持久的高亮度微聚焦光源
专利的具有高立体采集角的单次反射多层膜光学聚焦镜
样品和探测器上光束尺寸二维可控

为了保证X射线散射的最佳测试质量，包括稀释的或对比度低的样品，Xeuss 3.0将10多年研发的高光通量和低噪音技术相结合。

主要集成功能包括：

从聚焦镜到探测器传感层的全真空系统
第三代无散射准直（于2008年由Xenocs首次引入市场）
真空中运行的无窗口探测器
混合像素光子计数探测器
专利的宇宙背景自动扣除技术，减少环境寄生散射的影响

配备MetalJet光源，用于非常快的动力学研究。

Q-Xoom具有非常大的探测面积

Q-Xoom采用电脑控制探测器全程移动，自动调节样品到探测器距离，提供最大的测试灵活性来优化实验。

虚拟探测器增强测试能力：在任意的样品到探测器距离下，结合图谱重构技术，任何规格的探测器的采集面积都将大于200 mm²x 200 mm²。

超大探测面积有利于优化各向异性样品信号的方位角覆盖，还有利于高分辨率测试，例如在距离样品较远处用偏置的探测器采集到更大的散射矢量，以表征较小的尺度。

Discover Nano-inXider

Discover BioXolver

Nano-inXider specifications



Source and optics	Microfocus sealed tube: Cu, 30W/30µm, point focus. ( DIN EN 12543-5) Patented 2D single reflection multilayer optics.
Detector	Dectris Pilatus 3 hybrid photon counting detectors. Two fixed detectors for continuously and simultaneously. SAXS and WAXS acquisition up to 2θ=60°.
Beam Path	Windowless beam path entirely under vacuum from beam delivery system to detector sensor
Key features	Clean Beam technology: high flux and low background beamline. Beamstopless measurement: SAXS acquisition continuously without any beamstop. Virtual detector mode: > 200° azimuth coverage with rotation of sample.
Measurement capability	Nanoparticles size up to 250 nm in diameter.
Sample environment	Standard holders: solids, capillaries, powders. Sample holders for powders and gels. Flow cells for liquids: --- Low noise flow cell --- Capillary flow cell --- Automatic Sample Changer Temperature stages: --- Multi-purpose X-Ray Temperature Stage (-30°C to 150°C) --- High temperature sample stage (-150°C to 350°C) --- Extended high temperature sample stage (amb - 1000°C) Tensile Stage (0-200N). GiSAXS stage compatible with high temperature sample stage. Custom stages on request.
Software	Acquisition software with automatic data reduction in absolute units and live data display. XSACT (X-ray Scattering Analysis and Calculation Tool) for data analysis and interpretation.
General parameters	Fooprint: < 1x1 m². Weight: ~ 520 kg. Maximum power consumption: < 2000 W (single phase power). Self-contained: no external fluids required.
Warranty	Two years warranty and three years on X ray source.

Contact us for more detailed specifications

BioXolver specifications


BioXolver configurations	BioXolver	BioXolver L
Utilisation	Research on biological macro-molecules in solution	Research on biological macro-molecules, including large complexes and interactions
X-ray source	Microfocus GeniX 3D, MetalJet, add-on to RAG	0.02-0.3nm
Optic	Aspheric single reflection multilayer optic
Collimation	Motorized scatterless point collimation	variable
Sample cell	Xenocs thermalized BioCube flow-cell with camera and pump
Sample handling	Pipetting robot with disposable tips
Sample capacity	Up to 2 x 96 well plates (thermalized)
Minimum sample volume	Down to 5 μL
Cleaning	Automated cleaning and drying with three cleaning fluids
Detector	Dectris in-vacuum hybrid pixel photon counting detector
Detector configuration	Fixed detector distance	Variable detector distance
Data reduction and analysis software	RAW and ATSAS
Q-range and typical protein size*	0.006 Å-1 / MW < 200 MDa / Rg < 135 Å	0.003 Å-1 / MW < 1.5 GDa / Rg < 270 Å
Overall length	3.2 m (2.7 m as add-on to existing source)	4.2 m
Options	UV-Vis, separate temperature control for sample trays and BioCube	UV-Vis, separate temperature control for sample trays and BioCube
Services	Installation, training, hot-line, maintenance contract	Installation, training, hot-line, maintenance contract

*Theoretical limit assuming globular proteins

Nano-inXider specifications



Source and optics	Microfocus sealed tube: Cu, 30W/30µm, point focus. ( DIN EN 12543-5) Patented 2D single reflection multilayer optics.
Detector	Dectris Pilatus 3 hybrid photon counting detectors. Two fixed detectors for continuously and simultaneously. SAXS and WAXS acquisition up to 2θ=60°.
Beam Path	Windowless beam path entirely under vacuum from beam delivery system to detector sensor
Key features	Clean Beam technology: high flux and low background beamline. Beamstopless measurement: SAXS acquisition continuously without any beamstop. Virtual detector mode: > 200° azimuth coverage with rotation of sample.
Measurement capability	Nanoparticles size up to 250 nm in diameter.
Sample environment	Standard holders: solids, capillaries, powders. Sample holders for powders and gels. Flow cells for liquids: --- Low noise flow cell --- Capillary flow cell --- Automatic Sample Changer Temperature stages: --- Multi-purpose X-Ray Temperature Stage (-30°C to 150°C) --- High temperature sample stage (-150°C to 350°C) --- Extended high temperature sample stage (amb - 1000°C) Tensile Stage (0-200N). GiSAXS stage compatible with high temperature sample stage. Custom stages on request.
Software	Acquisition software with automatic data reduction in absolute units and live data display. XSACT (X-ray Scattering Analysis and Calculation Tool) for data analysis and interpretation.
General parameters	Fooprint: < 1x1 m². Weight: ~ 520 kg. Maximum power consumption: < 2000 W (single phase power). Self-contained: no external fluids required.
Warranty	Two years warranty and three years on X ray source.

Contact us for more detailed specifications

Xeuss 3.0 specifications



Source	Microfocus sealed tube: Cu, 30W/30µm, point focus. ( DIN EN 12543-5) MetalJet source D2+ (Ga). Motorized Dual source or triple source (Cu/Mo/Cr/Ga).
Optics	Patented 2D single reflection multilayer optics.
Detector	In-vacuum motorized 3-axis detectors for 2D SAXS/WAXS (Q-Xoom): --Pilatus3 R 300K hybrid photon counting detector --Eiger2 R (1M, 4M) hybrid photon counting detectors Optional WAXS detectors for SWAXS: --Pilatus3 R 100K hybrid photon counting detector --Motorized 3-axis Eiger2 R 500K hybrid photon counting detector
Sample chamber	Large vacuum chamber. On-axis sample viewing (parallax free). Attachments for operation of sample in air.
Key features	Clean Beam technology: high flux and low background beamline. Beamstopless measurement: SAXS acquisition continuously without any beamstop. Q-Xoom: Automatic change of measurement configuration over all instrument Q-range with no movement of sample measuring position. Virtual detector mode: surfaces of detection > 200 mm² x 200 mm².
Measurement capability	Nanoparticles size up to 300 nm or 500 nm in diameter depending on Xeuss model. Nanoparticles size up to > 4.5 microns with optional motorized Bonse-Hart module for automatic sequential USAXS/SAXS measurements. Scattering measurements up to 2Ɵ>70° with Q-Xoom. Qmax > 49 nm^-1
Sample environment	Standard holders (multi-samples): solids, capillaries, powders. Sample holders for powders and gels. Flowcells for liquids: --- Low noise flowcell --- Capillary flowcell --- Automatic Sample Changer Temperature stages: --- Multi-purpose X-Ray Temperature Stage (-30°C to 150°C) --- High temperature sample stage (-150°C to 350°C) --- Extended high temperature sample stage (amb - 1000°C) Tensile Stage (0-200N). Humidity stage (10%-90% from ambient to 60°C). Shear stage Temperature compatible GiSAXS stage Other sample stages available under request
Software	Acquisition software with automatic data reduction in absolute units and live data display. XSACT (X-ray Scattering Analysis and Calculation Tool) for data analysis and interpretation.
General parameters	Models & Footprint : Xeuss 3.0 C (1 m x 3 m), HR (1 m x 5 m), UHR (1 m x 8 m). Maximum power consumption: < 3000 W (single phase power)

Contact us for more detailed specifications

样品空间大

Xeuss 3.0的超大样品腔有利于固定实验过程中的样品，这是目前以至今后的理想的X射线散射平台仪器。

先进材料的研究和表征需要集成特定的或定制的样品环境。
由于其先进的线站理念，Xeuss 3.0非常适用于这种新项目。

包括：

在测试过程中样品在大样品腔中保持固定（轴方向可持续观察样品，智能集成用户自定义样品环境）
样品台的长距离平移可用于空间分布扫描和批量测试
多种标准样品环境，并具备样品台识别功能

X射线光束传输系统

创新的设计和FOX3D单反射聚焦镜的结合使GeniX3D成为市场上独特的解决方案。

由于其低成本、环保的封装方式，高通量的性能，密封管聚焦点光源正逐渐成为X射线分析仪器的标准配置。基于这一技术，Xenocs已经开发了高性能的X射线光源传输系统: GeniX3D。

创新设计和FOX3D单反射聚焦镜的结合使GeniX3D成为市场上独特的解决方案。GeniX3D因其光束强度、清晰度、稳定性、易于集成和可靠性在市场上颇为突出。

GeniX3D可配有不同的能量和光束几何形状，应用领域非常广泛。

由于其独特的性能、易于操作和可靠性，GeniX3D已经成为新型的X射线光源取代过时的X射线光源的标志。

视频：GeniX3D, X射线光源传输系统

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我们的产品范围

高通量解决方案


Model	Beam size at focus (µm)	Divergence (mrad)	Flux (ph/sec)	Typical application
GeniX 3D Cu High Flux *	< 190	6	> 400 x 10⁶	Protein crystallography Micro stress analysis Powder diffraction
GeniX 3D Mo High Flux	< 130	5	> 25 x 10⁶	Small Molecule crystallography High pressure
GeniX 3D Cr High Flux	< 190	6	> 300 x 10⁶	Stress Analysis
GeniX 3D Cu High Convergence *	60	70 x 35	> 400 x 10⁶	Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film
GeniX 3D Cu Low Convergence *	< 250	3	> 120 x 10⁶	Small Angle X-ray Scattering Protein Crystallography

* 也可配备低能光源（钒，铬）

小焦斑解决方案


Model	Beam size at focus (µm)	Divergence (mrad)	Flux (ph/sec)	Typical application
GeniX 3D Cr Micro Spot	< 30	17	> 12 x 10⁶	Stress Analysis Micro-XRF Micro-XRD
GeniX 3D Cu Micro Spot	< 30	17	> 18 x 10⁶	Stress Analysis Micro-XRF Micro-XRD
GeniX 3D Mo Micro Spot	< 55	10	> 1.8 x 10⁶	Micro-XRF Micro-XRD
GeniX 3D Cu High Convergence *	60	70 x 35	> 400 x 10⁶	Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film

* 也可配备低能光源（V, Cr）

X射线光束附件

除了我们的高质量的聚焦镜元件和光束传输系统，我们还提供可选配件供您选择，以使您的设备能达到最优配置。

请详细了解报价，并随时与我们联系，来讨论您的项目和您的具体需求。


Model	Detailed specifications
Synchrotron scatterless slits (♦)	Please contact us for any technical information Discover what our customers say about it!
X-ray alignment camera (♦)	Please contact us for any technical information
Pin Diode detector (♦)	Please contact us for any technical information
Beam stop with integrated Pin Diode	Please contact us for any technical information

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寻求报价

X射线聚焦镜

Xenocs为XRD和XRF应用提供了许多不同种类的聚焦镜。

Xenocs基于全球专利和超过14年的研发，成为世界上唯一一家提供单反射多层聚焦镜的公司。这些聚焦镜的效率通常比标准的多反射聚焦镜（也称为Montel聚焦镜）高出50%。

基于专有的光反射技术，Xenocs能够提供具有强大性能的创新聚焦镜设计，这是迄今为止其他现有制造技术无法实现的。


Mirror type	Figure	Optic efficiency (calculated over mirror length for 70µm source)
Standard Montel mirrors		Eff = 42%
Xenocs FOX 3D mirrors		Eff = 62%

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寻求报价

应用于XRD设备

2D-3D光束成型X射线聚焦镜

高通量聚焦镜


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 3D Cu 14-39 (♦)	0.19 x 0.19	5.4	Protein crystallography (♦) Powder diffraction
FOX 3D Cu 12-53	0.3 x 0.3	3	Protein crystallography (Long Unit Cells) Powder diffraction
FOX 3D Mo 10-31	0.13 x 0.13	4	Small molecule crystallography High pressure diffraction
FOX 3D Ag 10-30	0.13 x 0.13	3	Small molecule crystallography High pressure diffraction
FOX 3D Cr 8-30	0.20 x 0.20	6	Protein crystallography (S-SAD) Stress analysis
FOX 1D Cu 12-53	0.3	3	XRD, Powder Diffraction

小光斑聚焦镜


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 2D Mo 25-25 (♦)	0.08 x 0.08	5	Small mollecule crystallography High pressure crystallography
FOX 2D Cu 25-25 (♦)	0.08 x 0.08	5.3	Protein crystallography (♦) Micro Diffraction, Reflectometry
FOX 3D Cu 21-21 HC (♦)	0.08 x 0.08	70 x 35	Rapid x-ray Reflectometry (full beam) Scanning x-ray Reflectometry (with slit) Micro-XRF
FOX 3D Cu 28-10	0.04 x 0.04	17	Stress Analysis, Micro-diffraction, Micro-XRF
FOX 3D Cr 30-8	0.04 x 0.04	17	Stress Analysis, Micro-diffraction, Micro-XRF

准直聚焦镜


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 2D Cu 12-INF (♦)	1.2 x 1.2	1	Small angle x-ray scattering (♦) High resolution x-ray diffraction (♦) Surface scattering (♦) Thin film analysis (reflectometry stress) (♦) Microdiffraction on synchrotron (♦)
FOX 2D Mo 25-INF (♦)	0.85 x 1.3	0.5	Small angle x-ray scattering High resolution x-ray diffraction Surface scattering
FOX 2D 12-60 L (♦)	0.18 x 0.2	0.5 x 2	High resolution diffraction Small sample analysis
FOX 1D Cu 12-INF (♦)	1.2	0.8	High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering

1D光束成型X射线聚焦镜

高通量聚焦镜


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 1D Cu 12-53	0.3	3	XRD, Powder Diffraction

准直聚焦镜


Model	Beam size at focus (mm) with 60 µm source	Divergence (mrad)	Typical application
FOX 1D Cu 12-INF (♦)	1.2	0.8	High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering

应用于XRF上的产品

Xenocs凭借其在多层涂层、表面成型和先进的测量技术方面的丰富经验，开发了一系列高性能的XRF分析仪聚焦镜。

凭借其独特的复型技术，Xenocs已经开发了新的光束分析仪，提高了探测下限，增大了可检测量。

XRF聚焦镜


Element of interest	Reference
O, F, Na, Mg, Al, Si, P, S	XAN-1
Nitrogen	XAN-2
Carbon	XAN-3
Boron	XAN-4
Mg, Al , Si	XAN-5
Be	XAN-6

可直接发表的高质量图片展示

XSACT结合所有工具来创建可直接发布的图表，无需其他的可视化软件，这大大节约了时间。

为了更好地解读输出数据，科学家必须拥有直观、可交流和可比较大量图示的工具。
通过将数据处理与高级直观功能的结合，XSACT软件的使用可加快从数据采集到发表的工作流程。

高度可定制性的数据可视化
轻松导出多种格式
高清矢量图

联系我们看动态演示

高通量测量

可对高达192个样品进行全自动测试。

通过内置的移液机械臂和自动软件组件，BioXolver的标准孔盘可以自动装样和测试，为用户带来更高的测试效益。

可以测试更多样品
样品测试周期时间短
保证测量结果的重现性

机器装载样品

移液机械臂通过使用一次性移液管避免了样品的交叉污染，无管处理以及全自动样品池清洗和干燥有效避免了造成样品流失。

用于数据分析的自动化软件包

BioXolver具有强大的数据处理软件BioXTAS RAW，且广泛应用于BioSAXS用户群体。

它可进行基本的数据操作和数据分析(Rg、分子量等)，以及使用ATSAS插件的高级分析。

对于高通量分析，自动分析功能可以帮您分析和汇总实验结果。

阅读应用手册

低成本

通过每天获得的纳米级信息，来加快您的材料加工流程或验证您的研究模型。

高回报
仪器的垂直设计减少了占用的实验室空间
方便技术人员操作
仪器的高使用率带来了科研成果的高产率
更环保

Nano-inXider低成本的特点主要得益于它的紧凑型设计和操作成本低。

紧凑型仪器

占地面积 < 1×1 m²
重量 ≈ 520 kg
一体化设备
容易安装水平样品

操作成本低

平均功耗低 ≈ 700 W
仪器两年质保
质保三年的免维护光源
简洁且坚固

直接从样品到结果

通过Nano-inXider智能化的设计，只需将您的样品放置在样品仓里即可。然后就能得到结果。过程非常简单快捷。

样品

操作简单。只需将您的样品放置在样品仓里即可。
仪器可进行自动校准，无需用户干预。

测试

自动快捷的数据采集流程。X射线散射数据自动归一化，无需用户校准。这是通过一个嵌入到全自动设备中的强大软件套件，以及独特的固定双探测器配置来实现的。

分析

仪器实时显示的精确散射数据可用于进行实时快速的样品反馈，或使用我们的XSACT软件进行进一步的辅助分析。分析功能选择广泛，只需点击几次就能快速获得纳米结构参数。

报告

XSACT生成的高质量可发表的图表，可以通过拖放或保存文件轻松地导出到其他文档。

了解更多关于Nano-inXider软件信息，有助于您更快获取样品信息。

节约时间

Nano-inXider能更快获取结果更简单地进行数据分析

简单易用。智能化的设计可以使研究小角散射的学者，研究材料科学的科学家及技术人员快速掌握。

具有完全的远程操作能力和自动校准，Nano-inXider将人为误差降到最低，并保证重现性和测量可追溯性。

是开放操作实验室的理想选择。

Nano-inXider全自动工作流程

Nano-inXider数据采集软件具有以下用户友好的互动界面:

在采集过程中实时查看2D和1D数据
自动校准
可追溯测试过程

无需任何用户干预，自动工作流程可以进行以下所有数据处理

从2D图像到1D曲线的数据还原
绝对强度归一化
自动降低宇宙背景来减少寄生散射的影响

XSACT分析软件

XSACT：X射线散射分析和计算工具

智能工作流程和用户体验
强大的数据分析算法组成
高质量可直接发表数据图

了解更多XSACT软件

X-ray beam accessories

In addition to our high quality optical components and beam delivery systems, we propose accessories to optimize the performance of your setup.

Please discover our offer and do not hesitate to contact us to talk about your project and your specific needs.


Model	Detailed specifications
Synchrotron scatterless slits (♦)	Please contact us for any technical information Discover what our customers say about it!
X-ray alignment camera (♦)	Please contact us for any technical information
Pin Diode detector (♦)	Please contact us for any technical information
Beam stop with integrated Pin Diode	Please contact us for any technical information

Contact us

Request a quote

Low sample volume consumption

Down to 5μL. The lowest sample consumption on the market.

High precision positioning of small sample volumes is ensured by the conjunction of an in-line pipetting robot and the BioCUBE, an advanced capillary flow cell, coupled to machine vision for sample monitoring.

Such low total consumption per sample condition or concentration is highly beneficial for biostructural research.

Less precious sample is needed.
More experiments can be performed from the same preparation volume.

BioCUBE

Tubeless handling of sample volume down to 5 μl. This is unique on the market.

Each sample is first automatically injected into the BioCUBE measurement cell with the tubeless pipetting robot, then positioned into the beam for measurement with dynamic real-time continuous control of its position.

The sample is maintained at the selected temperature both in the well plate during storage and in the BioCUBE during measurements.

Optionally, the BioCUBE may also be provided with integrated UV/Vis capabilities.

Machine Vision control of 5 μl sample volumes

Using machine vision technology, the BioXolver is able to keep a digital eye on the sample at all times.

Once loaded, the sample is positioned with high precision in the X-ray beam while continuous feedback is provided to the automated control software to keep the volume in place.

Directly from samples to results

With the Nano-inXider SMART design, just put your sample in the chamber. Then get your results. It is simple and fast.

Sample

Simple. Just put your sample in the chamber.
The instrument auto-aligns without any need of user interaction.

Measurement

Data acquisition workflow is automatic and fast. X-ray scattering data is automatically normalized with no need of calibration by the user. This is achieved through a powerful software suite embedded in a fully motorized equipment using a unique fixed dual detector configuration.

Analysis

Accurate scattering data instantly displayed by the instrument can be used on the fly for quick sample feedback, or for further assisted analysis using our XSACT software. A large choice of analysis functions is available and quick nanostructure parameters are provided through few clicks.

Report

XSACT produces high quality publication-ready graphs and figures which can be easily exported to other documents through drag-and-drop or saved as files.

Learn more below about the Nano-inXider softwares which is central to obtain quick results on your sample.

Time-saving

The Nano-inXider provides fast answers and straightforward analysis.

It is easy to use. Its SMART design ensures a fast learning curve for both scattering experts, material scientists or technicians.

With full remote operation capability and auto alignment, the Nano-inXider reduces human errors to the minimum, and guarantees reproducibility as well as measurement traceability.

It is ideal for open access labs.

Nano-inXider automatic workflow

The Nano-inXider data acquisition software features a user friendly interactive interface with:

Live view of 2D and 1D data from on-going acquisition
Auto-alignment of the machine
Traceability of measures

Without any user interaction, the automatic workflow enables for all data treatments:

Data reduction from 2D image to 1D curve
Absolute intensity normalization
Automatic cosmic background reduction to reduce the impact of ambient parasitic scattering

XSACT analysis software

XSACT: X-ray Scattering Analysis and Calculation Tool

Smart workflow and user experience
Large and powerful suite of data analysis algorithms
High quality and publication-ready figures

Looking at the order and texture in the sample surface

What is measured?

One measures the long range order parameters of a nano-structured surface (GISAXS) or its atomic scale structure (GIWAXS).

The 2D scattering data gives an indication of the presence of such ordering while 1D data plotting along a given direction can give information about structure characteristic dimensions or orientation.

Figure 1. Wedge corrected grazing incidence wide angle x-ray scattering data acquired on a P3HT:PCBM thin film on a silicon substrate. The raw data is transformed with XSACT software such as to illustrate the in-plane and out-of-plane scattering patterns.

Samples

Typical samples for this measurement are polymers, inorganic materials of the following structure:

Nanopatterned surfaces

Nanostructured or porous thin films

Nanolayered materials (stackings)

Methods & standards

Advantages of SAXS

Why use SAXS for surface structure and patterns determination?

Statistical relevance : get information from several layers or surface

Adapted for conducting or non conducting materials

Non destructive method

Compatible with in-situ dynamic experiments (temperature, drying)

Products

All these measurements are possible directly in your lab.

Nano-inXider

Smart nanoscale characterization

Xeuss 3.0

The Next Generation (GI-)SAXS/WAXS/USAXS beamline for the laboratory