Xenocs XSACT software

X-ray Scattering Analysis and Calculation Tool

  • Smart workflow and user experience

  • Extensive and powerful suite of data analysis algorithms

  • High quality and publication-ready figures

  • Advanced data processing

SAXS Data Analysis

Wide range of analysis functions

for a broad range of applications

The XSACT software package contains key analysis functions for the treatment and interpretation of SAXS data

  • Structural evolution as a function of an external parameter, such as temperature or mechanical stress

  • Structural characterization of proteins

  • Determination of the mass concentration of a suspension

  • Size distribution and specific surface area determination of nanoparticules

  • Degree of crystallinity in mixed amorphous/ordered materials

Key benefits & features

Smart workflow and user experience

Extensive and powerful suite of data analysis algorithms

High quality and publication-ready figures

Advanced data processing

Services

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Smart workflow and user experience

Let XSACT guide you from data to results with minimum user input.

XSACT follows our SMART design for an easy workflow that guides you through powerful graphical interactions.

  • Fast data treatment
  • Easy to use
  • Adapted to beginners and experts alike

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SMART design

Sample – Measurement – Analysis – Reporting – Time-saving

  • Plot data with ease according to acquisition conditions
  • Clean formatting of auto-generated reports
  • Cross-platform software for Windows/Linux

 

Extensive and powerful suite of data analysis algorithms

XSACT includes an extensive array of analysis modules for sample characterization such as size, structure and texture of multiple types of materials.

With all the data analysis features included in one single package, XSACT offers a unified, versatile and complete data processing solution to get things done as fast as possible. All analysis modules come with full documentation and practice data.

XSACT key analysis modules include:

  • Unique capability for particle sizing
  • Evaluation of specific surface
  • Evolution of scattering data in function of measurement parameter
  • Measurement data simulator

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Unique capability for particle sizing

  • Xenocs-exclusive solution based on Expectation Maximization algorithm
  • Parameter-free method to extract the size distribution of a particle
    system
  • High performance and statistical uncertainties provided

Evaluation of specific surfaces

  • Gets the characteristic surfaces (mass specific surface area, surface to volume ratio) of nano-objects
  • Possible applications include nanoparticles in dispersions, dry powders, pores in granular media or interfaces in nanostructured solids

Evolution of scattering data in function of measurement parameter

  • Study impact of external measurement parameter (temperature, stress…)
  • Study impact of acquisition parameter (sample position, …)
  • Quick data plot through header search tool

XSACT measurement data simulator

  • Adjust the sample or instrument properties to simulate the scattering intensity
  • Estimate the smearing effect due to the instrumental resolution

Publication quality figure presentation

XSACT is a time saver as it bundles all the tools to create publication-ready figures without the need for another visualization software.

For the best understanding of output data, a scientist must have the tools to visualize, exchange and compare numerous graphical representations.
By combining data processing with advanced visualization capabilities, XSACT speeds up your workflow from acquisition to publication.

  • Highly customizable data visualization
  • Easy export in multiple formats
  • High quality with vector graphics

Advanced data processing

Xenocs instruments offer automatic 2D data reduction into a 1D scattering curve in quantitative units to facilitate the subsequent analysis. For samples requiring specific representation and study of 2D scattering data such as anisotropic samples or thin films studied in grazing incidence, XSACT represents the data in the reciprocal space with no information loss, and provides all the tools for quick orientation analysis and display.

  • 2D image reduction towards scattering intensities in absolute units
  • Q space representation of 2D data (transmission, GiSAXS, GiWAXS)
  • Automatic scattering image stitching for multiple acquisition

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2D image reduction towards scattering intensities in absolute units

  • Azimuthal averaging
  • Azimuthal profile
  • Intensity projections in the reciprocal space

SAXS Data Analysis

SAXS Data Analysis

SAXS Data Analysis – Fast Particle Size Distribution

SAXS Data Analysis – Fast Particle Size Distribution, Nanostructure – Save Your Time With Smart Workflow Software Embedding Powerfull Algorithms