Our mission is to help our customers in their research, development and production of advanced materials, through our solutions for characterization at the nanoscale.

Our passion

We have a passion for providing our customers with innovative and reliable products and services that enable new results and insight.


  • Customer satisfaction

We always strive to satisfy our customers through quality products and services

  • Innovation

We innovate for the benefit of our customers

  • Skills and motivation

A skilled and motivated team working together with respect for the individual

  • Responsibility and sustainability

We care about the environment and the social impact of our business

Our team

Our team builds on decades of experience with x-ray instrumentation and materials characterization.

We employ more than 120 people from 12 different nationalities at four locations around the world.

Our story

Xenocs was created in 2000 as a spin-off from Institute Laue Langevin by Frédéric Bossan and Peter Høghøj.

After developing aspheric multilayer coated x-ray optic, Xenocs developed the GeniX, a combination of micro-focus source and x-ray optics, in 2006, bringing new performance to x-ray XRD instrumentation at a fraction of the energy consumption used by traditional x-ray sources.

Scatterless slits were added to the product portfolio before Xenocs delivered its first x-ray scattering equipment in 2008, setting new standards for the possibilities using SAXS in the laboratory for characterization at the nano-scale.

Working closely with both academic and corporate customers, Xenocs has continuously focused on providing value through performance and ease of use, while also creating a global sales and service organization.

In 2016, Xenocs bought Saxslab with operations in Denmark and in Massachusetts, USA and set up a subsidiary in Singapore, making it the leading provider of SAXS equipment in both Asia, Americas and Europe.

With more than 100 customers and installed instruments, we continue to see the potential for expanding the use of X-ray scattering for characterization at the nano-scale over a wide range of applications.