Small Angle X-ray Scattering is a characterization technique enabling to study the size and shape of materials at the nanoscale. Typical range of observations with SAXS is from a few nanometers to 250 nm. With Wide Angle X-ray Scattering (WAXS) you get information on the crystalline structure of your sample at the atomic level. Grazing-Incidence SAXS and Grazing-Incidence WAXS (GI-SAXS/ GI-WAXS) enable you to analyze the structure of thin films or to collect information from surface layers.
Characterization with Small Angle X-ray Scattering
Discover some of the measurements you can do with Small Angle X-ray Scattering (SAXS) and Wide Angle X-Ray Scattering (WAXS)
Small angle x-ray scattering and its related techniques are used in many research fields, for all types of samples, such as solutions, gels, powders or solids.
You will find below a selection of measurements and information you can get with small angle x-ray scattering and its related techniques.
For each of the measurements, an explanation of what is measured is presented, with a list of typical samples. You will also find some methods and standards used as well as a summary of the advantages of using small angle x-ray scattering for each specific measurement.
More on Small Angle X-ray Scattering
In standard measuring configuration, the incoming X-ray beam is transmitted through a sample, with an exposed volume in the order of one mm3. The scattered X-rays are collected on a detector and the scattering pattern is analyzed to determine the global structural information of the sample.
With Grazing Incidence measuring configuration, the X-ray beam hits the sample with grazing incidence, enabling you to analyze the structure of thin films, or to collect information from surface layers only. The related techniques are Grazing-incidence SAXS and Grazing-incidence WAXS (GI-SAXS/ GI-WAXS) depending on the length scales of the structural parameter to be probed.
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