Home » SAXS Products » Components
Necessary cookies are absolutely essential for the website to function properly. This category only includes cookies that ensures basic functionalities and security features of the website. These cookies do not store any personal information.
Any cookies that may not be particularly necessary for the website to function and is used specifically to collect user personal data via analytics, ads, other embedded contents are termed as non-necessary cookies. It is mandatory to procure user consent prior to running these cookies on your website.
Sealed tube micro sources are becoming a standard in x-ray analytical equipments as they provide high useful flux in a low cost of ownership, eco friendly package. Based on this technology, Xenocs has developed a high performance x-ray beam delivery system: the GeniX3D.
The combination of an innovative design and the FOX3D single reflection optics makes the GeniX3D a unique solution on the market. The GeniX3D stands out for its beam intensity, definition and stability, its ease of integration and reliability.
The GeniX3D comes in different energies and beam geometry to cover a large range of applications.
Thanks to its unique performance, ergonomics and reliability, the GeniX3D has become the reference among the leading Original Equipment Manufacturers of X-ray analytical equipments.
Model | Beam size at focus (µm) | Divergence (mrad) | Flux (ph/sec) | Typical application |
GeniX 3D Cu High Flux * | < 190 | 6 | > 400 x 106 | Protein crystallography Micro stress analysis Powder diffraction |
GeniX 3D Mo High Flux | < 130 | 5 | > 25 x 106 | Small Molecule crystallography High pressure |
GeniX 3D Cr High Flux | < 190 | 6 | > 300 x 106 | Stress Analysis |
GeniX 3D Cu High Convergence * | 60 | 70 x 35 | > 400 x 106 | Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film |
GeniX 3D Cu Low Convergence * | < 250 | 3 | > 120 x 106 | Small Angle X-ray Scattering Protein Crystallography |
* Configurations also available for short energy radiation (V, Cr)
Model | Beam size at focus (µm) | Divergence (mrad) | Flux (ph/sec) | Typical application |
GeniX 3D Cr Micro Spot | < 30 | 17 | > 12 x 106 | Stress Analysis Micro-XRF Micro-XRD |
GeniX 3D Cu Micro Spot | < 30 | 17 | > 18 x 106 | Stress Analysis Micro-XRF Micro-XRD |
GeniX 3D Mo Micro Spot | < 55 | 10 | > 1.8 x 106 | Micro-XRF Micro-XRD |
GeniX 3D Cu High Convergence * | 60 | 70 x 35 | > 400 x 106 | Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film |
* Configurations also available for short energy radiation (V, Cr)
Based on worldwide patents and more than 14 years of Research and Development, Xenocs is the only company in the world proposing single reflection multilayer optics. These optics offer typically 50% more efficiency than standard multiple reflection optics, also called Montel optics.
Based on its proprietary replication technology, Xenocs is able to offer innovative optical designs with unmatched performance, which up to now have been impossible to achieve with other existing manufacturing techniques.
Mirror type | Figure | Optic efficiency (calculated over mirror length for 70µm source) |
Standard Montel mirrors | Eff = 42% | |
Xenocs FOX 3D mirrors | Eff = 62% |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 3D Cu 14-39 (♦) | 0.19 x 0.19 | 5.4 | Protein crystallography (♦) Powder diffraction |
FOX 3D Cu 12-53 | 0.3 x 0.3 | 3 | Protein crystallography (Long Unit Cells) Powder diffraction |
FOX 3D Mo 10-31 | 0.13 x 0.13 | 4 | Small molecule crystallography High pressure diffraction |
FOX 3D Ag 10-30 | 0.13 x 0.13 | 3 | Small molecule crystallography High pressure diffraction |
FOX 3D Cr 8-30 | 0.20 x 0.20 | 6 | Protein crystallography (S-SAD) Stress analysis |
FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 2D Mo 25-25 (♦) | 0.08 x 0.08 | 5 | Small mollecule crystallography High pressure crystallography |
FOX 2D Cu 25-25 (♦) | 0.08 x 0.08 | 5.3 | Protein crystallography (♦) Micro Diffraction, Reflectometry |
FOX 3D Cu 21-21 HC (♦) | 0.08 x 0.08 | 70 x 35 | Rapid x-ray Reflectometry (full beam) Scanning x-ray Reflectometry (with slit) Micro-XRF |
FOX 3D Cu 28-10 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
FOX 3D Cr 30-8 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 2D Cu 12-INF (♦) | 1.2 x 1.2 | 1 | Small angle x-ray scattering (♦) High resolution x-ray diffraction (♦) Surface scattering (♦) Thin film analysis (reflectometry stress) (♦) Microdiffraction on synchrotron (♦) |
FOX 2D Mo 25-INF (♦) | 0.85 x 1.3 | 0.5 | Small angle x-ray scattering High resolution x-ray diffraction Surface scattering |
FOX 2D 12-60 L (♦) | 0.18 x 0.2 | 0.5 x 2 | High resolution diffraction Small sample analysis |
FOX 1D Cu 12-INF (♦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 1D Cu 12-INF (♦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
Based on its extended experience in multilayer coatings, surface shaping, and advanced metrology, Xenocs has developed a broad range of high performance XRF analyzer optics.
With its unique replication technology, Xenocs has developed new analyzer geometries that lead to improved lower limits of detection and increased measurement throughput.
Element of interest | Reference |
O, F, Na, Mg, Al, Si, P, S | XAN-1 |
Nitrogen | XAN-2 |
Carbon | XAN-3 |
Boron | XAN-4 |
Mg, Al , Si | XAN-5 |
Be | XAN-6 |
Please discover our offer and do not hesitate to contact us to talk about your project and your specific needs.
Model | Detailed specifications |
Synchrotron scatterless slits (♦) | Please contact us for any technical information Discover what our customers say about it! |
X-ray alignment camera (♦) | Please contact us for any technical information |
Pin Diode detector (♦) | Please contact us for any technical information |
Beam stop with integrated Pin Diode | Please contact us for any technical information |