Development of polymers, foams, composites, biomaterials for new applications require not only the understanding of their material structure but also evaluating the impact of manufacturing processes and conditions of use. By measuring the macrostructure of processed or heterogenous materials, in combination with the Xeuss Pro scattering measurements, InXight module helps understanding the relationship between macrostructural  heterogeneities and nano- or atomic-structure.

The large field of view of the X-ray image and its resolution down to tens of microns is ideal for selecting points of interest for local scattering measurements.

Through the fast switching of measurement configuration, InXight enables operando dynamic studies while collecting both X-ray images and X-ray scattering patterns.

Typical materials for analysis include polymers, composites, glasses, or thin inorganic samples.

Heterogeneous samples with similar sample density generate low attenuation contrast in standard radiography. InXight equipped with the DF-PCI option provides additional image components which enhance the understanding of such samples.

The DF-PCI option reveals structure edges, interfaces (phase-contrast image component) or nanostructure presence (dark-field image component). The orientation of the dark-field signal maps the anisotropy in the sample structure, enabling optimal targeting of scattering experiments. 

InXight patented* measuring configuration includes an X-ray imaging source producing a cone-shaped beam to illuminate samples positioned on the Xeuss Pro sample stage with a large field of view and project the X-ray transmission image on the Q-Xoom detector.

Motorized and fast switch of X-ray sources ensure automatic sequential X-ray scattering and X-ray imaging on the same sample.

* Patent EP 3 845 892 B1, US 11 796 485, patent pending in Japan, China.

The Dark-Field and Phase-Contrast Imaging (DF-PCI) option for InXight modulates the X-ray beam to derive additional information on the samples.

Using a beam modulator associated with state-of-the-art numerical algorithms, InXight DF-PCI provides separated image components:
– attenuation (related to sample density),
– phase shifts (sensitive to interfaces),
– dark-field (indicating the presence and orientation of nanostructures).

The DF-PCI option is fully integrated in the imaging workflow. The additional imaging modalities extend the capabilities of InXight for coupled imaging and scattering experiments on complex samples.