InXight is an X-ray imaging module option for the Xeuss 3.0 offering a fast and automatic switch between X-ray scattering measurements and X-ray imaging.
It expands the capabilities of the Xeuss 3.0 instrument by enabling you to:
InXight X-ray imaging module
- Access structural information of your samples from ร to mm
- Target with imaging and probe with scattering
- Reveal nanostructure differences, interfaces and orientation with InXight Dark-field and Phase-contrast imaging (DF-PCI) option.
Get the bigger picture on your samples
Development of polymers, foams, composites, biomaterials for new applications require not only the understanding of their material structure but also evaluating the impact of manufacturing processes and conditions of use. By measuring the macrostructure of processed or heterogenous materials, in combination with the Xeuss 3.0 scattering measurements, InXight module helps understanding the relationship between macrostructural ย heterogeneities and nano- or atomic-structure.
The large field of view of the X-ray image and its resolution down to tens of microns is ideal for selecting points of interest for local scattering measurements.
Through the fast switching of measurement configuration, InXight enables operando dynamic studies while collecting both X-ray images and X-ray scattering patterns.
Typical materials for analysis include polymers, composites, glasses, or thin inorganic samples.
Map orientation of your sample structure
Heterogeneous samples with similar sample density generate low attenuation contrast in standard radiography. InXight equipped with the DF-PCI option provides additional image components which enhance the understanding of such samples.
The DF-PCI option reveals structure edges, interfaces (phase-contrast image component) or nanostructure presence (dark-field image component). The orientation of the dark-field signal maps the anisotropy in the sample structure, enabling optimal targeting of scattering experiments.ย
Fig.1 Left: Directional dark-field image (InXight DF-PCI) of two bundles of carbon fibers and one nylon wire.
Right: SAXS pattern of A1 vertical and A2 diagonal bundles, corroborating the dark-field information.
Automatic and fast switch of X-ray sources between scattering and imaging
InXight patented* measuring configuration includes an X-ray imaging source producing a cone-shaped beam to illuminate samples positioned on the Xeuss 3.0 sample stage with a large field of view and project the X-ray transmission image on the Q-Xoom detector.
Motorized and fast switch of X-ray sources ensure automatic sequential X-ray scattering and X-ray imaging on the same sample.
* Patent EP 3 845 892 B1, US 11 796 485, patent pending in Japan, China.
InXight with DF-PCI option
The Dark-Field and Phase-Contrast Imaging (DF-PCI) option for InXight modulates the X-ray beam to derive additional information on the samples.
Using a beam modulator associated with state-of-the-art numerical algorithms, InXight DF-PCI provides separated image components:
– attenuation (related to sample density),
– phase shifts (sensitive to interfaces),
– dark-field (indicating the presence and orientation of nanostructures).
The DF-PCI option is fully integrated in the imaging workflow. The additional imaging modalities extend the capabilities of InXight for coupled imaging and scattering experiments on complex samples.
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