Based on worldwide patents and more than 14 years of Research and Development, Xenocs is the only company in the world proposing single reflection multilayer optics. These optics offer typically 50% more efficiency than standard multiple reflection optics, also called Montel optics.
Based on its proprietary replication technology, Xenocs is able to offer innovative optical designs with unmatched performance, which up to now have been impossible to achieve with other existing manufacturing techniques.
| Mirror type | Figure | Optic efficiency (calculated over mirror length for 70Āµm source) |
| Standard Montel mirrors |  | Eff = 42% |
| Xenocs FOX 3D mirrors |  | Eff = 62% |
| Model | Beam size at focus (mm) with 60 Āµm source | Divergence (mrad) | Typical application |
| FOX 3D Cu 14-39 (ā¦) | 0.19 x 0.19 | 5.4 | Protein crystallography (ā¦) Powder diffraction |
| FOX 3D Cu 12-53 | 0.3 x 0.3 | 3 | Protein crystallography (Long Unit Cells) Powder diffraction |
| FOX 3D Mo 10-31 | 0.13 x 0.13 | 4 | Small molecule crystallography High pressure diffraction |
| FOX 3D Ag 10-30 | 0.13 x 0.13 | 3 | Small molecule crystallography High pressure diffraction |
| FOX 3D Cr 8-30 | 0.20 x 0.20 | 6 | Protein crystallography (S-SAD) Stress analysis |
| FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
| Model | Beam size at focus (mm) with 60 Āµm source | Divergence (mrad) | Typical application |
| FOX 2D Mo 25-25 (ā¦) | 0.08 x 0.08 | 5 | Small mollecule crystallography High pressure crystallography |
| FOX 2D Cu 25-25 (ā¦) | 0.08 x 0.08 | 5.3 | Protein crystallography (ā¦) Micro Diffraction, Reflectometry |
| FOX 3D Cu 21-21 HC (ā¦) | 0.08 x 0.08 | 70 x 35 | Rapid x-ray Reflectometry (full beam) Scanning x-ray Reflectometry (with slit) Micro-XRF |
| FOX 3D Cu 28-10 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
| FOX 3D Cr 30-8 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
| Model | Beam size at focus (mm) with 60 Āµm source | Divergence (mrad) | Typical application |
| FOX 2D Cu 12-INF (ā¦) | 1.2 x 1.2 | 1 | Small angle x-ray scattering (ā¦) High resolution x-ray diffraction (ā¦) Surface scattering (ā¦) Thin film analysis (reflectometry stress) (ā¦) Microdiffraction on synchrotron (ā¦) |
| FOX 2D Mo 25-INF (ā¦) | 0.85 x 1.3 | 0.5 | Small angle x-ray scattering High resolution x-ray diffraction Surface scattering |
| FOX 2D 12-60 L (ā¦) | 0.18 x 0.2 | 0.5 x 2 | High resolution diffraction Small sample analysis |
| FOX 1D Cu 12-INF (ā¦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
| Model | Beam size at focus (mm) with 60 Āµm source | Divergence (mrad) | Typical application |
| FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
| Model | Beam size at focus (mm) with 60 Āµm source | Divergence (mrad) | Typical application |
| FOX 1D Cu 12-INF (ā¦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
Advanced materials research and characterization could require integration of specific or customized sample environments.
Xeuss 3.0 is perfectly adapted for such new projects thanks to its state of the art beamline concept.
It provides:
In particular, the following key features enable the user to optimize experiments or results:
SAXS acquisition continuously without any beamstop provides High Dynamic Range data.
No parasitic scattering from beamstop edges or detector window allows noise-free scattering at low q.
The direct beam is recorded simultaneously with the sample scattering profile during acquisition for accurate transmitted intensity measurement, used to obtain a precise absolute intensity normalization.
In addition, the direct beam profile thus measured is integrated in the data analysis (XSACT) to improve the accuracy of the results.
As a standard solution, Xeuss 3.0 integrates low maintenance microfocus beam delivery systems to provide very high flux levels previously only possible with high power rotating anode sources.
Advanced experiments such as kinetic studies or shape analysis of diluted samples can now be performed in the lab.
In addition, Xenocs X-ray beam delivery systems coupled with motorized scatterless collimation achieve high resolution (low Īq beam), which is essential for studying large characteristic dimensions or for performing accurate mesophase analysis.
The high useful flux together with the high resolution capability are achieved through the combination of:
To ensure the best quality of X-ray scattering measurements, including on diluted or low contrast samples, Xeuss 3.0 combines high flux with low noise technology, which is the fruit of more than 10 years of development.
Key integrated features are:
For applications requiring very fast kinetics Xeuss 3.0 can also be delivered with a MetalJet source.
The Q-Xoom features full range computer-controlled detector travel to automatically adjust the sample-to-detector distance offering maximum flexibility of measurement for experiment optimization.
The virtual detector increases the measuring capabilities offering surfaces of collection larger than 200 mm2 x 200 mm2 at any sample-to-detector distance independently of detector size with automatic data reconstruction.
The large surface of detection is beneficial to optimize the azimuthal coverage in case of anisotropic samples or to benefit from high resolution measurement settings by characterizing smaller length scales (larger wave vectors) at longer sample to detector distance by a detector offset.
Advanced nanomaterials development and design require characterization over a large range of length scales. The Xeuss 3.0 offers such measuring capability over up to 5 orders in magnitude in q (wave vector) through entirely motorized change of configurations. Any trained user can thus operate the system remotely over its complete measurement range for a given sample or batch of samples.
Automatic change of measuring settings include:
– Q-Xoom change of measurement resolution through motorized translation of detector
– Sequential SAXS /USAXS measurement with Bonse-Hart USAXS module
– Change of energy radiation, up to 3 energies
– Movable WAXS detector for out of equilibrium in situ SWAXS studies
The Nano-inXider features a smart dual detector design to detect atomic scale information and nanostructure simultaneously within one exposure. Long sample-to-detector distance for measuring large characteristic dimensions is achieved in SAXS through a vertical design with a small footprint.
Such configuration provides unique benefits:
With the Nano-inXider, the sample and the detectors are fixed. The optional WAXS detector extends the scattering range from the SAXS detector seamlessly throught 2Ę=60Ā°.
Such a unique vertical design provides unique benefits:
For anisotropic samples like fibers or oriented films, the Nano-inXider is equipped with a sample rotation stage that acquires the anisotropic scattering. The automatic acquisition involves the following steps:
The SAXS community relies on multiple algorithms with custom models and many different applications. XSACT offers a unified, versatile and complete data processing solution to get things done as fast as possible.
The low cost of ownership of the Nano-inXider mainly comes from its compactness and low cost of operation
The Nano-inXider acquires high signal to noise data by measuring the intense direct beam transmitted through the sample together with lowĀ intensity signal scattered from the sample.
Direct beam measurement, achieved with innovative beamstop-less data acquisition, enables automatic data treatment and display in absolute intensity with a very high accuracy.
Simultaneous low intensity signals detection is rendered possible by implementation of Clean Beam Technology.
The high dynamic range of intensity collection directly impacts data quality by:
– Enabling the detection of low intensity scattered signal from weakly scattering samples
– Accessing absolute quantity parameters such as particles number, molar mass, concentration, specific surface
– Detecting large characteristic dimensions without need of user data treatment
The Nano-inXider integrates 15 years of R&D in the field of advanced components and instrument design to achieve an optimized balance of high X-ray flux on sample together with low parasitic scattering generated by the instrument.
Clean Beam Technology embeds the following key components and features:
The Nano-inXider measures SAXS without any beamstop and simultaneously collects the direct beam transmitted through the sample together with the scattered signal down to very low intensity levels.
Such high dynamic range data collection is rendered possible by innovative beamstop-less data acquisition.
The direct beam is recorded all along the acquisition, which leads to an accurate transmitted measurement used to obtain a precise absolute intensity normalization.
In addition, the measured direct beam profile (resolution function) is integrated in the data analysis to improve results quality.
Xenocs beamstop-less data acquisition integrates automatic qmin determination depending on the sample and benefits from no parasitic scattering from beamstop edges for high data quality at low q.
Automatic cosmic background removal reduces the impact of ambient parasitic scattering.
For the best understanding of output data, a scientist must have the tools to visualize, exchange and compare numerous graphical representations.
By combining data processing with advanced visualization capabilities, XSACT speeds up your workflow from acquisition to publication.
With the BioXolver you get:
Due to weak scattering from biological samples, high quality SAXS measurements require an instrument optimized for maximum X-ray intensity and lowest possible background noise. The BioXolver offers a unique combination of both capability in particular with:
The BioXolver can be installed with different source options.
It can integrate a MetalJet source to obtain the highest X-ray beam intensity possible in a laboratory instrument.
It can also be installed with the Genix3D, a bright microfocus low maintenance source with intensity levels only previously accessible with high power rotating anode sources. Such performance is achieved by combining the Genix3D long lasting source with new patented FOX 3D multilayer optics having a very high solid angle.
The BioXolver comes with windowless hybrid photon counting (HPC) detectors which allows for beamstopless measurements.
By operating without beamstop the direct beam is recorded all along the acquisition, which leads to an accurate transmission measurement used to obtain a precise absolute intensity normalization.
Moreover, operating without beamstop reduces the lowest scattering angle achievable as it is no more limited by beamstop size but is sample dependent.
The BioXolver uses state of the art collimation slits that greatly reduce noise and provide a clean beam.
High quality detection is achieved with hybrid photon counting (HPC) detectors integrated inside vacuum with no interfering window in front of detector sensor (windowless detector). This ensures that weakly scattering samples can also be measured at low concentrations.
Overall measuring background level of the instrument is further improved by proprietary automatic cosmic background removal algorithms suppressing high energy cosmics hitting the detector.
With the BioXolver standard well plates can be loaded & measured automatically using in-line pipetting robot & automated software suite for high user benefits.
The BioXolver includes powerful data reduction BioXTAS RAW widely used by the BioSAXS community.
It enables standard data operation and data analysis (Rg, molecular weight, etc.), together with advanced analysis using ATSAS plugins.
For high throughput analysis, the automated analysis function analyzes and compiles the results for you.
Sample size separation using size-exclusion chromatography in combination with the BioXolver can not only be used to ensure clean monodisperse samples, but also facilitates research on structurally heterogeneous & aggregation-prone multi-domain proteins as well as heterogeneous protein complexes in dynamic equilibria.
The BioXolver will work with any HPLC system, simply position the HPLC next to the instrument and hook up the column to the BioCUBE flow cell. The in-line UV/Vis ensures accurate determination of the sample concentration exactly at the SAXS exposure position. The included analysis software automatically reduces and provides an easy overview of your entire SEC-SAXS run and makes further analysis easy.
In situ UV measurement directly in the measurement cell provides concentration information of the sample before and after X-ray exposure or during a SEC-SAXS experiment.
This is especially important in this case as the sample is diluted in the transport path from the (HPLC) column exit to the x-ray exposure position.
XSACTēęŗč½åč®¾č®”äøŗęØåø¦ę„äŗē®åēå·„ä½ęµēØļ¼å¹¶éčæå¼ŗ大ēå¾å½¢äŗ¤äŗåč½åø®å©ęØč·å¾ē»ęć
XSACTēęŗč½åč®¾č®”äøŗęØåø¦ę„äŗē®åēå·„ä½ęµēØļ¼å¹¶éčæå¼ŗ大ēå¾å½¢äŗ¤äŗåč½åø®å©ęØč·å¾ē»ęć
éčæBioXolverļ¼ęØåÆ仄å¾å°ļ¼
ē±äŗēē©ę ·åē微弱ę£å°ļ¼é«č“ØéēSAXSęµééč¦äøå°ä»ŖåØę„č¾¾å°ę大Xå°ēŗæå¼ŗåŗ¦åå°½åÆč½ä½ēčęÆåŖé³ćéčæ仄äøęęÆēē»åļ¼BioXolverå ·å¤äŗčæäø¤ē§ē¬ē¹ēåč½:
BioXolveråÆ仄é å¤äøåēå ęŗć
åÆ仄ē»åMetalJetå ęŗļ¼åØå®éŖ室ä»ŖåØäøč·å¾å°½åÆč½é«ēXå°ēŗæå ęå¼ŗåŗ¦ć
ä¹åÆ仄å®č£ Genix3Dļ¼äøē§ä½ē»“ę¤ęę¬ēé«äŗ®åŗ¦å¾®čē¦å ęŗļ¼å ¶å¼ŗåŗ¦ä»„ååŖęé«åēé³ęč½¬é¶ęč½č¾¾å°ćčæē§ę§č½éčæē»åGenix3DčēØå ęŗäøå ·ęč¶ é«ē«ä½č§ćę°ēäøå©FOX 3Då¤å±ččē¦éå®ē°ć
BioXolveré å¤äŗę ēŖå£čę··åå åļ¼HPCļ¼ę¢ęµåØļ¼č½å¤å®ē°ę beamstopęµčÆć
åØę beamstopę åµäøļ¼ę“äøŖęµčÆčæēØäøäøē“č®°å½ē“éå ļ¼éčæåē”®ēéå°ęµčÆę„å¾å°åē”®ēē»åƹå¼ŗåŗ¦ę ”ę£ć
ę¤å¤ļ¼ē±äŗäøåbeamstopå°ŗåÆøéå¶ļ¼čåŖäøę ·åęå ³ļ¼ę beamstpęµčÆåÆå¾å°ę“å°ēęå°ę£å°č§åŗ¦ć
BioXolveréēØäŗęå čæēåē“ēē¼ļ¼ę大å°éä½äŗåŖé³ļ¼ä»čå¾å°äŗēŗÆåå ęć
éčæåØēē©ŗäøå©ēØę··åå åč®”ę°ļ¼HPCļ¼ę¢ęµåØļ¼äøę¢ęµåØä¼ ęåØļ¼ę ēŖå£čę¢ęµåØļ¼åé¢ę å¹²ę°ļ¼å®ē°äŗé«č“Øéēę£ęµćčæåÆē”®äæå¼±ę£å°ę ·åä¹åÆ仄åØä½ęµåŗ¦äøęµéć
éēØäøēØēå®å®čęÆčŖåØå»é¤ę³ļ¼ęå¶é«č½å®å®å°ēŗæļ¼čæäøę„éä½äŗä»ŖåØę“ä½ēčęÆåŖé³ć
BioXolverē»åäŗå°ŗåÆøęé»č²č°±ę³ę„čæč”åŗå«ę ·å大å°ļ¼äøä» åÆ仄äæčÆę ·åå®å Øååę£ļ¼čæč½äæčæåƹē»ęå¼č“Øäøęäŗčéēå¤åčē½ä»„ååØęå¹³č””äøå¼č“Øčē½å¤åē©ēē ē©¶ć
BioXolveréēØäŗä»»ä½HPLCē³»ē»ļ¼åŖéå°HPLCē½®äŗä»ŖåØęč¾¹ļ¼å¹¶å°č²č°±ę±čæę„å°BioCUBEęµåØę± ćåØēŗæUV/Visč½å¤ē”®äæåØSAXSęå ä½ē½®ē²¾ē”®ęµéę ·åęµåŗ¦ćčŖåø¦ēåęč½Æ件åÆčŖåØē®åę¦čæ°ę“äøŖSEC-SAXSčæč”čæēØļ¼čæä½æå¾čæäøę„åęę“å 容ęć
ē±äŗåä½UVęµčÆē“ę„åØęµčÆę± čæč”ļ¼åØXå°ēŗæęå ä¹ååä¹åęåØSEC-SAXSęµčÆäøé½č½å¾å°ę ·åēęµåŗ¦äæ”ęÆć
å äøŗę ·ååØä»(HPLC)ę±åŗå£å°Xå°ēŗæęå ä½ē½®ēä¼ č¾čæēØäøä¼č¢«ēØéļ¼ę仄åØčæē§ę åµäøļ¼čæäøē¹å°¤äøŗéč¦ć
éčæå ē½®ē§»ę¶²ęŗę¢°čļ¼ęÆē»ē®”ęµåØę± BioCUBE仄åęŗę¢°č§č§ēē»ååÆ¹ę ·åčæč”ēęµļ¼ē”®äæäŗå°éę ·åēé«ē²¾åŗ¦å®ä½ć
åØäøåēÆå¢ęęµåŗ¦äøę ·åę»ę¶čä½ļ¼åƹēē©ē»ęē ē©¶éåøøęēć
ę ē®”ęä½ē”®äæę ·åę¶čéä½č³5 Ī¼lćčæåØåē±»ä»ŖåØäøęÆē¬äøę äŗēć
ęÆäøŖę ·åé¦å ē±ę ē®”ē§»ę¶²ęŗę¢°ččŖåØę³Øå „å°BioCUBEęµéę± äøļ¼ē¶åå®ä½å°å ęäøčæč”ęµéļ¼å¹¶å®ę¶åÆ¹å ¶ä½ē½®čæč”čæē»ę§å¶ć
ę ·ååØåēäøåØåęé“ååØBioCUBEęµčÆęé“é½å§ē»äæęåØéå®ēęø©åŗ¦äøć
ęØčæåÆ仄éę©å ·ęéęUV/Visåč½ēBioCUBEć
å©ēØęŗę¢°č§č§ęęÆļ¼BioXolverč½å¤éę¶åÆ¹ę ·åčæč”ę°ååēę§ć
ę ·åč£ č½½åå°±ä¼č¢«åē”®å°å®ä½åØXå°ēŗæå ęäøļ¼åę¶ęē»åé¦ē»ęē»čŖåØę§å¶č½Æ件ę„äæęå ęäøēę ·åéäøåć
SAXSēØę·ē¾¤å¾åäŗå ·ęčŖå®ä¹ęØ”ååå¤ē§äøååŗēØēØåŗēē®ę³ćXSACTęä¾ēē»äøćå Øé¢äøå®ę“ēę°ę®å¤ēč§£å³ę¹ę”åÆå°½åæ«å®ęä»»å”ć
Nano-inXiderē¬ē¹ēęŗč½ååę¢ęµåØč®¾č®”ļ¼åÆ仄åØäøꬔęå å åę¶ę£ęµå°ååå°ŗåŗ¦äæ”ęÆåēŗ³ē±³ē»ęćč®¾å¤å å°é¢ē§Æå°ēåē“č®¾č®”ļ¼ę ·åå°ę¢ęµåØč·ē¦»éæļ¼åÆ仄ęµé大ēē¹å¾å°ŗåÆøć
čæäŗé ē½®åÆ仄ęä¾ä»„äøē¬ē¹ēä¼åæļ¼
Nano-inXiderēę ·ååę¢ęµåØé½ęÆåŗå®ēćåÆéēWAXSę¢ęµåØé ē½®ę©å¤§äŗę£å°čå“ļ¼åÆ仄ę ē¼č”ę„SAXSę¢ęµåØļ¼å¾å°ēę°ę®č¾¾å°2Īø=60Ā°ć
čæē¬ē¹ēåē“č®¾č®”ę仄äøä¼åæļ¼
åƹäŗēŗ¤ē»“ęååččēååå¼ę§ę ·åļ¼Nano-inXideré å¤äøäøŖę ·åęč½¬å°åÆ仄č·å¾ååå¼ę§ę£å°äæ”å·ćčŖåØééå ę¬ä»„äøę„éŖ¤:
Nano-inXideråÆ仄éčæęµééčæę ·åēå¼ŗē“éå
åę ·åēä½ę£å°å¼ŗåŗ¦äæ”å·ę„č·å¾é«äæ”åŖęÆę°ę®ć
éčæå
čæēę beamstopę°ę®ééčæč”ē“éå
ęµéļ¼čŖåØå¤ēę°ę®å¹¶č·å¾åē”®åŗ¦é«ēē»åƹå¼ŗåŗ¦ć
ēŗÆåå
ęęÆåÆ仄å®ē°åę¶ę£ęµä½å¼ŗåŗ¦äæ”å·åé«å¼ŗåŗ¦äæ”å·ć
å¼ŗåŗ¦ééēé«åØęčå“ē“ę„å½±åę°ę®č“Øéļ¼
– č½å¤ę£ęµå¼±ę£å°ę ·åēä½å¼ŗåŗ¦ę£å°äæ”å·
– å®éč·å¾ē²åę°ćę©å°č“Øéćęµåŗ¦ćęÆč”Øé¢ē§Æēåę°
– ę¢ęµå¤§ē¹å¾å°ŗåÆøļ¼ę éēØę·čæč”ę°ę®å¤ē
Nano-inXideréčæåØå čæē»ä»¶åä»ŖåØč®¾č®”äøéæč¾¾15幓ēē åļ¼č¾¾å°äŗåØę ·åäøé«Xå°ēŗæééäøä»ŖåØäŗ§ēēä½åÆēę£å°ēęä½³å¹³č””ć
ēŗÆåå ęęÆå ·ę仄äøäø»č¦ē»ä»¶åē¹ē¹ļ¼
Nano-inXiderę éä»»ä½beamstopå°±åÆ仄čæč”SAXSęµéļ¼čæåÆ仄åę¶éééčæę ·åēē“éå åéåøøä½å¼ŗåŗ¦ę£å°äæ”å·ć
éčæå čæēę beamstopę°ę®ééåÆå®ē°é«åØęčå“ēę°ę®ę¶éć
åØę“äøŖēééčæēØäøč®°å½ē“éå ļ¼ä½æéå°ęµčÆę“åē”®ļ¼ä»čä½æē»åƹę£å°å¼ŗåŗ¦ę ”ę£ę“åē”®ć
å¦å¤ļ¼č¢«ęµéēē“éå ļ¼åč¾Øēå½ę°ļ¼ä¼č¢«ę“åå°ę°ę®åęäøę„ęé«ęµéē»ęēč“Øéć
Xenocsę beamstopę°ę®ééå®ē°äŗåå³äŗę ·åēčŖåØqminęµéļ¼å¹¶äøę¶é¤äŗbeamstopč¾¹ē¼ēåÆēę£å°ļ¼ä»čåØä½qåŗåč·å¾é«č“Øéę°ę®ć
čŖåØå»é¤å®å®čęÆåÆ仄åå°ēÆå¢åÆēę£å°ēå½±åć
å čæēŗ³ē±³ęęēåå±åč®¾č®”éč¦åØč¶ å¤§ēŗ³ē±³å°ŗåŗ¦čå“äøčæč”č”Øå¾ćXeuss 3.0å ·å¤čæę ·ēęµčÆč½åļ¼éčæå®å ØčŖåØę¹åé ē½®ļ¼ééēę£å°ē¢éqåÆč·Øč¶5äøŖę°éēŗ§ćå ę¤ļ¼åƹäŗē»å®ēåäøŖęę¹éę ·åļ¼ä»»ä½ē»čæå¹č®ēēØę·é½åÆ仄åØå®ę“ēęµéčå“å čæēØęä½ē³»ē»ć
åÆčŖåØę“ę¹ēęµéč®¾ē½®å ę¬ļ¼
– Q-Xooméčæę¢ęµåØę²æå
č·ÆēčŖåØå¹³ē§»ę„ę¹åęµéåč¾Øē
-ä½æēØBonse Hart USAXSęØ”ååÆ仄å®ē°čæē»ēSAXS/USAXSęµé
– Xå
ęŗč½éåÆéļ¼ęä¾3äøŖåÆéå
ęŗ
– ēØäŗåä½SWAXSē ē©¶ēåÆē§»åØWAXSę¢ęµåØ
å°¤å ¶ļ¼ä»„äøå ³é®ē¹ē¹ä½æēØę·å¾ä»„ä¼åęä½³ēå®éŖåē»ę:
ę beamstopčæē»ééé«åØęčå“SAXSę°ę®ć
ęē»ę„čŖBeamstopč¾¹ē¼ęę¢ęµåØēŖå£čēåÆēę£å°ļ¼ä½æä½qå¤ēę£å°äæ”å·äøåå¹²ę°ćć
åØééčæēØäøåę¶č®°å½ē“éå åę ·åę£å°äæ”å·ļ¼å¾å°ē²¾ē”®ēéå°å¼ŗåŗ¦ļ¼ēØäŗč·åē²¾ē”®ēē»åƹå¼ŗåŗ¦ę ”ę£ć
å¦å¤ļ¼ééēē“éå äæ”å·å°ę“åå°ę°ę®åęč½Æ件ļ¼XSACTļ¼ļ¼ęé«č§£ęē»ęēåē”®ę§ć
ä½äøŗäøäøŖę åēč§£å³ę¹ę”ļ¼Xeuss 3.0éęä½ē»“ę¤ęę¬ēé«ę§č½å¾®čē¦å
ęŗļ¼äŗ®åŗ¦č¾¾å°äŗä¹åé«åēęč½¬é³ęé¶å
ęŗęč½å®ē°ēę°“å¹³ć
ē°åØå®éŖ室äøå°±åÆčæč”čÆøå¦åØåå¦ē ē©¶ęēØéę ·åēēŗ³ē±³ē²åå½¢ē¶åęēé«ēŗ§å®éŖć
å¦å¤ļ¼éčæē»åXenocså ¬åøēXå°ēŗæå ęåčŖåØę ę£å°åē“ē³»ē»å®ē°é«åč¾Øēļ¼å ęĪqä½ļ¼ļ¼čæåƹē ē©¶å¤§ē¹å¾å°ŗåÆøēę ·åęčæč”åē”®äøé“ēøēåęé½éåøøéč¦ć
éčæ仄äøē»åå®ē°é«å ééåé«åč¾Øēļ¼
äøŗäŗäæčÆXå°ēŗæę£å°ēęä½³ęµčÆč“Øéļ¼å ę¬ēØéēęåƹęÆåŗ¦ä½ēę ·åļ¼Xeuss 3.0å°10å¤å¹“ē åēé«å ééåä½åŖé³ęęÆēøē»åć
äø»č¦éęåč½å ę¬ļ¼
é å¤MetalJetå ęŗļ¼ēØäŗéåøøåæ«ēåØåå¦ē ē©¶ć
Q-XooméēØēµčę§å¶ę¢ęµåØå ØēØē§»åØļ¼čŖåØč°čę ·åå°ę¢ęµåØč·ē¦»ļ¼ęä¾ę大ēęµčÆēµę“»ę§ę„ä¼åå®éŖć
čęę¢ęµåØå¢å¼ŗęµčÆč½åļ¼åØä»»ęēę ·åå°ę¢ęµåØč·ē¦»äøļ¼ē»åå¾č°±éęęęÆļ¼ä»»ä½č§ę ¼ēę¢ęµåØēééé¢ē§Æé½å°å¤§äŗ200 mm2 x 200 mm2ć
č¶ å¤§ę¢ęµé¢ē§Æęå©äŗä¼åååå¼ę§ę ·åäæ”å·ēę¹ä½č§č¦ēļ¼čæęå©äŗé«åč¾ØēęµčÆļ¼ä¾å¦åØč·ē¦»ę ·åč¾čæå¤ēØåē½®ēę¢ęµåØééå°ę“大ēę£å°ē¢éļ¼ä»„č”Øå¾č¾å°ēå°ŗåŗ¦ć
å
čæęęēē ē©¶åč”Øå¾éč¦éęē¹å®ēęå®å¶ēę ·åēÆå¢ć
ē±äŗå
¶å
čæēēŗæē«ēåæµļ¼Xeuss 3.0éåøøéēØäŗčæē§ę°é”¹ē®ć
å ę¬ļ¼
Xenocsåŗäŗå Øēäøå©åč¶ čæ14幓ēē åļ¼ęäøŗäøēäøåÆäøäø家ęä¾ååå°å¤å±čē¦éēå ¬åøćčæäŗčē¦éēęēéåøøęÆę åēå¤åå°čē¦éļ¼ä¹ē§°äøŗMontelčē¦éļ¼é«åŗ50%ć
åŗäŗäøęēå åå°ęęÆļ¼Xenocsč½å¤ęä¾å ·ęå¼ŗ大ę§č½ēåę°čē¦éč®¾č®”ļ¼čæęÆčæä»äøŗę¢å ¶ä»ē°ęå¶é ęęÆę ę³å®ē°ēć
| Mirror type | Figure | Optic efficiency (calculated over mirror length for 70Āµm source) |
| Standard Montel mirrors | | Eff = 42% |
| Xenocs FOX 3D mirrors | | Eff = 62% |
| Model | Beam size at focus (mm) with 60 Āµm source | Divergence (mrad) | Typical application |
| FOX 3D Cu 14-39 (ā¦) | 0.19 x 0.19 | 5.4 | Protein crystallography (ā¦) Powder diffraction |
| FOX 3D Cu 12-53 | 0.3 x 0.3 | 3 | Protein crystallography (Long Unit Cells) Powder diffraction |
| FOX 3D Mo 10-31 | 0.13 x 0.13 | 4 | Small molecule crystallography High pressure diffraction |
| FOX 3D Ag 10-30 | 0.13 x 0.13 | 3 | Small molecule crystallography High pressure diffraction |
| FOX 3D Cr 8-30 | 0.20 x 0.20 | 6 | Protein crystallography (S-SAD) Stress analysis |
| FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
| Model | Beam size at focus (mm) with 60 Āµm source | Divergence (mrad) | Typical application |
| FOX 2D Mo 25-25 (ā¦) | 0.08 x 0.08 | 5 | Small mollecule crystallography High pressure crystallography |
| FOX 2D Cu 25-25 (ā¦) | 0.08 x 0.08 | 5.3 | Protein crystallography (ā¦) Micro Diffraction, Reflectometry |
| FOX 3D Cu 21-21 HC (ā¦) | 0.08 x 0.08 | 70 x 35 | Rapid x-ray Reflectometry (full beam) Scanning x-ray Reflectometry (with slit) Micro-XRF |
| FOX 3D Cu 28-10 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
| FOX 3D Cr 30-8 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
| Model | Beam size at focus (mm) with 60 Āµm source | Divergence (mrad) | Typical application |
| FOX 2D Cu 12-INF (ā¦) | 1.2 x 1.2 | 1 | Small angle x-ray scattering (ā¦) High resolution x-ray diffraction (ā¦) Surface scattering (ā¦) Thin film analysis (reflectometry stress) (ā¦) Microdiffraction on synchrotron (ā¦) |
| FOX 2D Mo 25-INF (ā¦) | 0.85 x 1.3 | 0.5 | Small angle x-ray scattering High resolution x-ray diffraction Surface scattering |
| FOX 2D 12-60 L (ā¦) | 0.18 x 0.2 | 0.5 x 2 | High resolution diffraction Small sample analysis |
| FOX 1D Cu 12-INF (ā¦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
| Model | Beam size at focus (mm) with 60 Āµm source | Divergence (mrad) | Typical application |
| FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
| Model | Beam size at focus (mm) with 60 Āµm source | Divergence (mrad) | Typical application |
| FOX 1D Cu 12-INF (ā¦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
Xenocsååå ¶åØå¤å±ę¶å±ćč”Øé¢ęååå čæēęµéęęÆę¹é¢ēäø°åÆē»éŖļ¼å¼åäŗäøē³»åé«ę§č½ēXRFåęä»Ŗčē¦éć
ååå ¶ē¬ē¹ēå¤åęęÆļ¼Xenocså·²ē»å¼åäŗę°ēå ęåęä»Ŗļ¼ęé«äŗę¢ęµäøéļ¼å¢å¤§äŗåÆę£ęµéć
| Element of interest | Reference |
| O, F, Na, Mg, Al, Si, P, S | XAN-1 |
| Nitrogen | XAN-2 |
| Carbon | XAN-3 |
| Boron | XAN-4 |
| Mg, Al , Si | XAN-5 |
| Be | XAN-6 |
äøŗäŗę“儽å°č§£čÆ»č¾åŗę°ę®ļ¼ē§å¦å®¶åæ
é”»ę„ęē“č§ćåÆäŗ¤ęµååÆęÆč¾å¤§éå¾ē¤ŗēå·„å
·ć
éčæå°ę°ę®å¤ēäøé«ēŗ§ē“č§åč½ēē»åļ¼XSACTč½Æ件ēä½æēØåÆå åæ«ä»ę°ę®ééå°åč”Øēå·„ä½ęµēØć
éčæå ē½®ēē§»ę¶²ęŗę¢°čåčŖåØč½Æ件ē»ä»¶ļ¼BioXolverēę ååēåÆ仄čŖåØč£ ę ·åęµčÆļ¼äøŗēØę·åø¦ę„ę“é«ēęµčÆęēć
BioXolverå ·ęå¼ŗ大ēę°ę®å¤ēč½Æ件BioXTAS RAWļ¼äøå¹æę³åŗēØäŗBioSAXSēØę·ē¾¤ä½ć
å®åÆčæč”åŗę¬ēę°ę®ęä½åę°ę®åę(Rgćååéē)ļ¼ä»„åä½æēØATSASę件ēé«ēŗ§åęć
åƹäŗé«ééåęļ¼čŖåØåęåč½åÆ仄åø®ęØåęåę±ę»å®éŖē»ęć
Nano-inXiderä½ęę¬ēē¹ē¹äø»č¦å¾ēäŗå®ēē“§ååč®¾č®”åęä½ęę¬ä½ć
Ā
ęä½ē®åćåŖéå°ęØēę ·åę¾ē½®åØę ·åä»éå³åÆć
ä»ŖåØåÆčæč”čŖåØę ”åļ¼ę éēØę·å¹²é¢ć
čŖåØåæ«ę·ēę°ę®ééęµēØćXå°ēŗæę£å°ę°ę®čŖåØå½äøåļ¼ę éēØę·ę ”åćčæęÆéčæäøäøŖåµå „å°å ØčŖåØč®¾å¤äøēå¼ŗ大č½Æ件å„件ļ¼ä»„åē¬ē¹ēåŗå®åę¢ęµåØé ē½®ę„å®ē°ēć
ä»ŖåØå®ę¶ę¾ē¤ŗēē²¾ē”®ę£å°ę°ę®åÆēØäŗčæč”å®ę¶åæ«éēę ·ååé¦ļ¼ęä½æēØę们ēXSACTč½Æ件čæč”čæäøę„ēč¾ å©åęćåęåč½éę©å¹æę³ļ¼åŖéē¹å»å ę¬”å°±č½åæ«éč·å¾ēŗ³ē±³ē»ęåę°ć
XSACTēęēé«č“ØéåÆåč”Øēå¾č”Øļ¼åÆ仄éčæęę¾ęäæåęä»¶č½»ę¾å°åƼåŗå°å ¶ä»ęę”£ć
äŗč§£ę“å¤å ³äŗNano-inXiderč½Æ件äæ”ęÆļ¼ęå©äŗęØę“åæ«č·åę ·åäæ”ęÆć
Nano-inXiderč½ę“åæ«č·åē»ęę“ē®åå°čæč”ę°ę®åę
ē®åęēØćęŗč½åēč®¾č®”åÆ仄ä½æē ē©¶å°č§ę£å°ēå¦č ļ¼ē ē©¶ęęē§å¦ēē§å¦å®¶åęęÆäŗŗååæ«éęę”ć
å ·ęå®å ØēčæēØęä½č½ååčŖåØę ”åļ¼Nano-inXiderå°äŗŗäøŗčÆÆå·®éå°ęä½ļ¼å¹¶äæčÆéē°ę§åęµéåÆčæ½ęŗÆę§ć
ęÆå¼ę¾ęä½å®éŖ室ēēę³éę©ć
