Based on worldwide patents and more than 14 years of Research and Development, Xenocs is the only company in the world proposing single reflection multilayer optics. These optics offer typically 50% more efficiency than standard multiple reflection optics, also called Montel optics.
Based on its proprietary replication technology, Xenocs is able to offer innovative optical designs with unmatched performance, which up to now have been impossible to achieve with other existing manufacturing techniques.
Mirror type | Figure | Optic efficiency (calculated over mirror length for 70µm source) |
Standard Montel mirrors | Eff = 42% | |
Xenocs FOX 3D mirrors | Eff = 62% |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 3D Cu 14-39 (ā¦) | 0.19 x 0.19 | 5.4 | Protein crystallography (ā¦) Powder diffraction |
FOX 3D Cu 12-53 | 0.3 x 0.3 | 3 | Protein crystallography (Long Unit Cells) Powder diffraction |
FOX 3D Mo 10-31 | 0.13 x 0.13 | 4 | Small molecule crystallography High pressure diffraction |
FOX 3D Ag 10-30 | 0.13 x 0.13 | 3 | Small molecule crystallography High pressure diffraction |
FOX 3D Cr 8-30 | 0.20 x 0.20 | 6 | Protein crystallography (S-SAD) Stress analysis |
FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 2D Mo 25-25 (ā¦) | 0.08 x 0.08 | 5 | Small mollecule crystallography High pressure crystallography |
FOX 2D Cu 25-25 (ā¦) | 0.08 x 0.08 | 5.3 | Protein crystallography (ā¦) Micro Diffraction, Reflectometry |
FOX 3D Cu 21-21 HC (ā¦) | 0.08 x 0.08 | 70 x 35 | Rapid x-ray Reflectometry (full beam) Scanning x-ray Reflectometry (with slit) Micro-XRF |
FOX 3D Cu 28-10 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
FOX 3D Cr 30-8 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 2D Cu 12-INF (ā¦) | 1.2 x 1.2 | 1 | Small angle x-ray scattering (ā¦) High resolution x-ray diffraction (ā¦) Surface scattering (ā¦) Thin film analysis (reflectometry stress) (ā¦) Microdiffraction on synchrotron (ā¦) |
FOX 2D Mo 25-INF (ā¦) | 0.85 x 1.3 | 0.5 | Small angle x-ray scattering High resolution x-ray diffraction Surface scattering |
FOX 2D 12-60 L (ā¦) | 0.18 x 0.2 | 0.5 x 2 | High resolution diffraction Small sample analysis |
FOX 1D Cu 12-INF (ā¦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 1D Cu 12-INF (ā¦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
Sealed tube micro sources are becoming a standard in x-ray analytical equipments as they provide high useful flux in a low cost of ownership, eco friendly package. Based on this technology, Xenocs has developed a high performance x-ray beam delivery system: theĀ GeniX3D.
The combination of an innovative design and the FOX3D single reflection optics makes theĀ GeniX3DĀ a unique solution on the market. TheĀ GeniX3DĀ stands out for its beam intensity, definition and stability, its ease of integration and reliability.
TheĀ GeniX3DĀ comes in different energies and beam geometry to cover a large range of applications.
Thanks to its unique performance, ergonomics and reliability, theĀ GeniX3DĀ has become the reference among the leading Original Equipment Manufacturers of X-ray analytical equipments.
Model | Beam size at focus (µm) | Divergence (mrad) | Flux (ph/sec) | Typical application |
GeniX 3D Cu High Flux * | < 190 | 6 | > 400 x 106 | Protein crystallography Micro stress analysis Powder diffraction |
GeniX 3D Mo High Flux | < 130 | 5 | > 25 x 106 | Small Molecule crystallography High pressure |
GeniX 3D Cr High Flux | < 190 | 6 | > 300 x 106 | Stress Analysis |
GeniX 3D Cu High Convergence * | 60 | 70 x 35 | > 400 x 106 | Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film |
GeniX 3D Cu Low Convergence * | < 250 | 3 | > 120 x 106 | Small Angle X-ray Scattering Protein Crystallography |
* Configurations also available for low energy radiation (V, Cr)
Model | Beam size at focus (µm) | Divergence (mrad) | Flux (ph/sec) | Typical application |
GeniX 3D Cr Micro Spot | < 30 | 17 | > 12 x 106 | Stress Analysis Micro-XRF Micro-XRD |
GeniX 3D Cu Micro Spot | < 30 | 17 | > 18 x 106 | Stress Analysis Micro-XRF Micro-XRD |
GeniX 3D Mo Micro Spot | < 55 | 10 | > 1.8 x 106 | Micro-XRF Micro-XRD |
GeniX 3D Cu High Convergence * | 60 | 70 x 35 | > 400 x 106 | Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film |
* Configurations also available for low energy radiation (V, Cr)
Please discover our offer and do not hesitate to contact us toĀ talk about your project and your specific needs.
Model | Detailed specifications |
Synchrotron scatterless slits (ā¦) | Please contact us for any technical information Discover what our customers say about it! |
X-ray alignment camera (ā¦) | Please contact us for any technical information |
Pin Diode detector (ā¦) | Please contact us for any technical information |
Beam stop with integrated Pin Diode | Please contact us for any technical information |
Source | Microfocus sealed tube: Cu, 30W/30µm*, point focus. (* DIN EN 12543-5)MetalJet source D2+ (Ga).Motorized Dual source or triple source (Cu/Mo/Cr/Ga). |
Optics | Patented 2D single reflection multilayer optics. |
Detector | In-vacuum motorized 3-axis detectors for 2D SAXS/WAXS (Q-Xoom):--Pilatus3 R 300K hybrid photon counting detector--Eiger2 R (1M, 4M) hybrid photon counting detectorsOptional WAXS detectors for SWAXS:--Pilatus3 R 100K hybrid photon counting detector--Motorized 3-axis Eiger2 R 500K hybrid photon counting detector |
Sample chamber | Large vacuum chamber.On-axis sample viewing (parallax free).Attachments for operation of sample in air. |
Key features | Clean Beam technology: high flux and low background beamline.Beamstopless measurement: SAXS acquisition continuously without any beamstop.Q-Xoom: Automatic change of measurement configuration over all instrument Q-range with no movement of sample measuring position.Virtual detector mode: surfaces of detection > 200 mm² x 200 mm². |
Measurement capability | Nanoparticles size up to 300 nm, 500 nm or 900 nm in diameter depending on Xeuss model. Nanoparticles size up to > 2.5 microns with optional motorized Bonse-Hart module for automatic sequential USAXS/SAXS/WAXS measurements.Scattering measurements up to 2Ę>70° with Q-Xoom. Qmax > 49 nm-1 |
Sample environment | Standard holders (multi-samples): solids, capillaries, powders.Sample holders for powders and gels.Flowcells for liquids: --- Low noise flowcell --- Capillary flowcell --- Automatic Sample Changer --- BioCube measuring cell with dynamic monitoring (compatible with pipetting robot)Temperature stages: --- Multi-purpose X-Ray Temperature Stage (-30°C to 150°C) --- High temperature sample stage (-150°C to 350°C) --- Extended high temperature sample stage (amb - 1000°C)Tensile Stage (00-600N).Humidity stage (10%-90% from ambient to 60°C).Shear stageTemperature compatible GiSAXS stageOther sample stages available under request |
Software | Acquisition software with automatic data reduction in absolute units and live data display.XSACT (X-ray Scattering Analysis and Calculation Tool) for data analysis and interpretation. |
General parameters | Models & Footprint : Xeuss 3.0 C (1 m x 3 m), HR (1 m x 5 m), UHR (1 m x 8 m). Maximum power consumption: < 3000 W (single phase power) |
Advanced materials research and characterization could require integration of specific or customized sample environments.
Xeuss 3.0 is perfectly adapted for such new projects thanks to its state of the art beamline concept.
It provides:
In particular, the following key features enable the user to optimize experiments or results:
SAXS acquisition continuously without any beamstop provides High Dynamic Range data.
No parasitic scattering from beamstop edges or detector window allows noise-free scattering at low q.
The direct beam is recorded simultaneously with the sample scattering profile during acquisition for accurate transmitted intensity measurement, used to obtain a precise absolute intensity normalization.
In addition, the direct beam profile thus measured is integrated in the data analysis (XSACT) to improve the accuracy of the results.
As a standard solution, Xeuss 3.0 integrates low maintenance microfocus beam delivery systems to provide very high flux levels previously only possible with high power rotating anode sources.
Advanced experiments such as kinetic studies or shape analysis of diluted samples can now be performed in the lab.
In addition, Xenocs X-ray beam delivery systems coupled with motorized scatterless collimation achieve high resolution (low Īq beam), which is essential for studying large characteristic dimensions or for performing accurate mesophase analysis.
The high useful flux together with the high resolution capability are achieved through the combination of:
To ensure the best quality of X-ray scattering measurements, including on diluted or low contrast samples, Xeuss 3.0 combines high flux with low noise technology, which is the fruit of more than 10 years of development.
Key integrated features are:
For applications requiring very fast kinetics Xeuss 3.0 can also be delivered with a MetalJet source.
The Q-Xoom features full range computer-controlled detector travel to automatically adjust the sample-to-detector distance offering maximum flexibility of measurement for experiment optimization.
The virtual detector increases the measuring capabilities offering surfaces of collection larger than 200 mm2 x 200 mm2 at any sample-to-detector distance independently of detector size with automatic data reconstruction.
The large surface of detection is beneficial to optimize the azimuthal coverage in case of anisotropic samples or to benefit from high resolution measurement settings by characterizing smaller length scales (larger wave vectors) at longer sample to detector distance by a detector offset.
Advanced nanomaterials development and design require characterization over a large range of length scales. The Xeuss 3.0 offers such measuring capability over up to 5 orders in magnitude in q (wave vector) through entirely motorized change of configurations. Any trained user can thus operate the system remotely over its complete measurement range for a given sample or batch of samples.
Automatic change of measuring settings include:
– Q-Xoom change of measurement resolution through motorized translation of detector
– Sequential SAXS /USAXS measurement with Bonse-Hart USAXS module
– Change of energy radiation, up to 3 energies
– Movable WAXS detector for out of equilibrium in situ SWAXS studies
The Nano-inXider features a smart dual detector design to detect atomic scale information and nanostructure simultaneously within one exposure. Long sample-to-detector distance for measuring large characteristic dimensions is achieved in SAXS through a vertical design with a small footprint.
Such configuration provides unique benefits:
With the Nano-inXider, the sample and the detectors are fixed. The optional WAXS detector extends the scattering range from the SAXS detector seamlessly throught 2Ę=60°.
Such a unique vertical design provides unique benefits:
For anisotropic samples like fibers or oriented films, the Nano-inXider is equipped with a sample rotation stage that acquires the anisotropic scattering. The automatic acquisition involves the following steps:
The SAXS community relies on multiple algorithms with custom models and many different applications. XSACT offers a unified, versatile and complete data processing solution to get things done as fast as possible.
The low cost of ownership of the Nano-inXider mainly comes from its compactness and low cost of operation
The Nano-inXider acquires high signal to noise data by measuring the intense direct beam transmitted through the sample together with lowĀ intensity signal scattered from the sample.
Direct beam measurement, achieved with innovative beamstop-less data acquisition, enables automatic data treatment and display in absolute intensity with a very high accuracy.
Simultaneous low intensity signals detection is rendered possible by implementation of Clean Beam Technology.
The high dynamic range of intensity collection directly impacts data quality by:
– Enabling the detection of low intensity scattered signal from weakly scattering samples
– Accessing absolute quantity parameters such as particles number, molar mass, concentration, specific surface
– Detecting large characteristic dimensions without need of user data treatment
The Nano-inXider integrates 15 years of R&D in the field of advanced components and instrument design to achieve an optimized balance of high X-ray flux on sample together with low parasitic scattering generated by the instrument.
Clean Beam Technology embeds the following key components and features:
The Nano-inXider measures SAXS without any beamstop and simultaneously collects the direct beam transmitted through the sample together with the scattered signal down to very low intensity levels.
Such high dynamic range data collection is rendered possible by innovative beamstop-less data acquisition.
The direct beam is recorded all along the acquisition, which leads to an accurate transmitted measurement used to obtain a precise absolute intensity normalization.
In addition, the measured direct beam profile (resolution function) is integrated in the data analysis to improve results quality.
Xenocs beamstop-less data acquisition integrates automatic qmin determination depending on the sample and benefits from no parasitic scattering from beamstop edges for high data quality at low q.
Automatic cosmic background removal reduces the impact of ambient parasitic scattering.
For the best understanding of output data, a scientist must have the tools to visualize, exchange and compare numerous graphical representations.
By combining data processing with advanced visualization capabilities, XSACT speeds up your workflow from acquisition to publication.
With the BioXolver you get:
Due to weak scattering from biological samples, high quality SAXS measurements require an instrument optimized for maximum X-ray intensity and lowest possible background noise. The BioXolver offers a unique combination of both capability in particular with:
The BioXolver can be installed with different source options.
It can integrate a MetalJet source to obtain the highest X-ray beam intensity possible in a laboratory instrument.
It can also be installed with the Genix3D, a bright microfocus low maintenance source with intensity levels only previously accessible with high power rotating anode sources. Such performance is achieved by combining the Genix3D long lasting source with new patented FOX 3D multilayer optics having a very high solid angle.
The BioXolver comes with windowless hybrid photon counting (HPC) detectors which allows for beamstopless measurements.
By operating without beamstop the direct beam is recorded all along the acquisition, which leads to an accurate transmission measurement used to obtain a precise absolute intensity normalization.
Moreover, operating without beamstop reduces the lowest scattering angle achievable as it is no more limited by beamstop size but is sample dependent.
The BioXolver uses state of the art collimation slits that greatly reduce noise and provide a clean beam.
High quality detection is achieved with hybrid photon counting (HPC) detectors integrated inside vacuum with no interfering window in front of detector sensor (windowless detector). This ensures that weakly scattering samples can also be measured at low concentrations.
Overall measuring background level of the instrument is further improved by proprietary automatic cosmic background removal algorithms suppressing high energy cosmics hitting the detector.
With the BioXolver standard well plates can be loaded & measured automatically using in-line pipetting robot & automated software suite for high user benefits.
The BioXolver includes powerful data reduction BioXTAS RAW widely used by the BioSAXS community.
It enables standard data operation and data analysis (Rg, molecular weight, etc.), together with advanced analysis using ATSAS plugins.
For high throughput analysis, the automated analysis function analyzes and compiles the results for you.
Sample size separation using size-exclusion chromatography in combination with the BioXolver can not only be used to ensure clean monodisperse samples, but also facilitates research on structurally heterogeneous & aggregation-prone multi-domain proteins as well as heterogeneous protein complexes in dynamic equilibria.
The BioXolver will work with any HPLC system, simply position the HPLC next to the instrument and hook up the column to the BioCUBE flow cell. The in-line UV/Vis ensures accurate determination of the sample concentration exactly at the SAXS exposure position. The included analysis software automatically reduces and provides an easy overview of your entire SEC-SAXS run and makes further analysis easy.
In situ UV measurement directly in the measurement cell provides concentration information of the sample before and after X-ray exposure or during a SEC-SAXS experiment.
This is especially important in this case as the sample is diluted in the transport path from the (HPLC) column exit to the x-ray exposure position.
BioXolver configurations | BioXolver | BioXolver L |
Utilisation | Research on biological macro-molecules in solution | Research on biological macro-molecules, including large complexes and interactions |
X-ray source | Microfocus GeniX 3D, MetalJet, add-on to RAG | 0.02-0.3nm |
Optic | Aspheric single reflection multilayer optic | |
Collimation | Motorized scatterless point collimation | variable |
Sample cell | Xenocs thermalized BioCube flow-cell with camera and pump | |
Sample handling | Pipetting robot with disposable tips | |
Sample capacity | Up to 2 x 96 well plates (thermalized) | |
Minimum sample volume | Down to 5 μL | |
Cleaning | Automated cleaning and drying with three cleaning fluids | |
Detector | Dectris in-vacuum hybrid pixel photon counting detector | |
Detector configuration | Fixed detector distance | Variable detector distance |
Data reduction and analysis software | RAW and ATSAS | |
Q-range and typical protein size* | 0.006 Ć -1 / MW < 200 MDa / Rg < 135 Ć | 0.003 Ć -1 / MW < 1.5 GDa / Rg < 270 Ć |
Overall length | 3.2 m (2.7 m as add-on to existing source) | 4.2 m |
Options | UV-Vis, separate temperature control for sample trays and BioCube | UV-Vis, separate temperature control for sample trays and BioCube |
Services | Installation, training, hot-line, maintenance contract | Installation, training, hot-line, maintenance contract |
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Source and optics | Microfocus sealed tube: Cu, 30W/30µm*, point focus. (* DIN EN 12543-5)Patented 2D single reflection multilayer optics. |
Detector | Dectris Pilatus 3 hybrid photon counting detectors.Two fixed detectors for continuously and simultaneously.SAXS and WAXS acquisition up to 2θ=60°. |
Beam Path | Windowless beam path entirely under vacuum from beam delivery system to detector sensor |
Key features | Clean Beam technology: high flux and low background beamline.Beamstopless measurement: SAXS acquisition continuously without any beamstop.Virtual detector mode: > 200° azimuth coverage with rotation of sample. |
Measurement capability | Nanoparticles size up to 250 nm in diameter. |
Sample environment | Standard holders: solids, capillaries, powders.Sample holders for powders and gels.Flow cells for liquids:--- Low noise flow cell--- Capillary flow cellAutomatic Sample ChangerTemperature stages:--- Multi-purpose X-Ray Temperature Stage (-20°C to 150°C)--- High temperature sample stage (-150°C to 350°C)--- Extended high temperature sample stage (amb - 700°C)Tensile Stage (0-200N).GiSAXS stage compatible with high temperature sample stage.Custom stages on request. |
Software | Acquisition software with automatic data reduction in absolute units and live data display.XSACT (X-ray Scattering Analysis and Calculation Tool) for data analysis and interpretation. |
General parameters | Fooprint: < 1x1 m².Weight: ~ 520 kg.Maximum power consumption: < 2000 W (single phase power).Self-contained: no external fluids required. |
Warranty | Two years warranty and three years on X ray source. |
BioXolver configurations | BioXolver | BioXolver L |
Utilisation | Research on biological macro-molecules in solution | Research on biological macro-molecules, including large complexes and interactions |
X-ray source | Microfocus GeniX 3D, MetalJet, add-on to RAG | 0.02-0.3nm |
Optic | Aspheric single reflection multilayer optic | |
Collimation | Motorized scatterless point collimation | variable |
Sample cell | Xenocs thermalized BioCube flow-cell with camera and pump | |
Sample handling | Pipetting robot with disposable tips | |
Sample capacity | Up to 2 x 96 well plates (thermalized) | |
Minimum sample volume | Down to 5 μL | |
Cleaning | Automated cleaning and drying with three cleaning fluids | |
Detector | Dectris in-vacuum hybrid pixel photon counting detector | |
Detector configuration | Fixed detector distance | Variable detector distance |
Data reduction and analysis software | RAW and ATSAS | |
Q-range and typical protein size* | 0.006 Ć -1 / MW < 200 MDa / Rg < 135 Ć | 0.003 Ć -1 / MW < 1.5 GDa / Rg < 270 Ć |
Overall length | 3.2 m (2.7 m as add-on to existing source) | 4.2 m |
Options | UV-Vis, separate temperature control for sample trays and BioCube | UV-Vis, separate temperature control for sample trays and BioCube |
Services | Installation, training, hot-line, maintenance contract | Installation, training, hot-line, maintenance contract |
Source and optics | Microfocus sealed tube: Cu, 30W/30µm*, point focus. (* DIN EN 12543-5)Patented 2D single reflection multilayer optics. |
Detector | Dectris Pilatus 3 hybrid photon counting detectors.Two fixed detectors for continuously and simultaneously.SAXS and WAXS acquisition up to 2θ=60°. |
Beam Path | Windowless beam path entirely under vacuum from beam delivery system to detector sensor |
Key features | Clean Beam technology: high flux and low background beamline.Beamstopless measurement: SAXS acquisition continuously without any beamstop.Virtual detector mode: > 200° azimuth coverage with rotation of sample. |
Measurement capability | Nanoparticles size up to 250 nm in diameter. |
Sample environment | Standard holders: solids, capillaries, powders.Sample holders for powders and gels.Flow cells for liquids:--- Low noise flow cell--- Capillary flow cellAutomatic Sample ChangerTemperature stages:--- Multi-purpose X-Ray Temperature Stage (-20°C to 150°C)--- High temperature sample stage (-150°C to 350°C)--- Extended high temperature sample stage (amb - 700°C)Tensile Stage (0-200N).GiSAXS stage compatible with high temperature sample stage.Custom stages on request. |
Software | Acquisition software with automatic data reduction in absolute units and live data display.XSACT (X-ray Scattering Analysis and Calculation Tool) for data analysis and interpretation. |
General parameters | Fooprint: < 1x1 m².Weight: ~ 520 kg.Maximum power consumption: < 2000 W (single phase power).Self-contained: no external fluids required. |
Warranty | Two years warranty and three years on X ray source. |
Source | Microfocus sealed tube: Cu, 30W/30µm*, point focus. (* DIN EN 12543-5)MetalJet source D2+ (Ga).Motorized Dual source or triple source (Cu/Mo/Cr/Ga). |
Optics | Patented 2D single reflection multilayer optics. |
Detector | In-vacuum motorized 3-axis detectors for 2D SAXS/WAXS (Q-Xoom):--Pilatus3 R 300K hybrid photon counting detector--Eiger2 R (1M, 4M) hybrid photon counting detectorsOptional WAXS detectors for SWAXS:--Pilatus3 R 100K hybrid photon counting detector--Motorized 3-axis Eiger2 R 500K hybrid photon counting detector |
Sample chamber | Large vacuum chamber.On-axis sample viewing (parallax free).Attachments for operation of sample in air. |
Key features | Clean Beam technology: high flux and low background beamline.Beamstopless measurement: SAXS acquisition continuously without any beamstop.Q-Xoom: Automatic change of measurement configuration over all instrument Q-range with no movement of sample measuring position.Virtual detector mode: surfaces of detection > 200 mm² x 200 mm². |
Measurement capability | Nanoparticles size up to 300 nm, 500 nm or 900 nm in diameter depending on Xeuss model. Nanoparticles size up to > 2.5 microns with optional motorized Bonse-Hart module for automatic sequential USAXS/SAXS/WAXS measurements.Scattering measurements up to 2Ę>70° with Q-Xoom. Qmax > 49 nm-1 |
Sample environment | Standard holders (multi-samples): solids, capillaries, powders.Sample holders for powders and gels.Flowcells for liquids: --- Low noise flowcell --- Capillary flowcell --- Automatic Sample Changer --- BioCube measuring cell with dynamic monitoring (compatible with pipetting robot)Temperature stages: --- Multi-purpose X-Ray Temperature Stage (-30°C to 150°C) --- High temperature sample stage (-150°C to 350°C) --- Extended high temperature sample stage (amb - 1000°C)Tensile Stage (00-600N).Humidity stage (10%-90% from ambient to 60°C).Shear stageTemperature compatible GiSAXS stageOther sample stages available under request |
Software | Acquisition software with automatic data reduction in absolute units and live data display.XSACT (X-ray Scattering Analysis and Calculation Tool) for data analysis and interpretation. |
General parameters | Models & Footprint : Xeuss 3.0 C (1 m x 3 m), HR (1 m x 5 m), UHR (1 m x 8 m). Maximum power consumption: < 3000 W (single phase power) |
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Model | Beam size at focus (µm) | Divergence (mrad) | Flux (ph/sec) | Typical application |
GeniX 3D Cu High Flux * | < 190 | 6 | > 400 x 106 | Protein crystallography Micro stress analysis Powder diffraction |
GeniX 3D Mo High Flux | < 130 | 5 | > 25 x 106 | Small Molecule crystallography High pressure |
GeniX 3D Cr High Flux | < 190 | 6 | > 300 x 106 | Stress Analysis |
GeniX 3D Cu High Convergence * | 60 | 70 x 35 | > 400 x 106 | Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film |
GeniX 3D Cu Low Convergence * | < 250 | 3 | > 120 x 106 | Small Angle X-ray Scattering Protein Crystallography |
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Model | Beam size at focus (µm) | Divergence (mrad) | Flux (ph/sec) | Typical application |
GeniX 3D Cr Micro Spot | < 30 | 17 | > 12 x 106 | Stress Analysis Micro-XRF Micro-XRD |
GeniX 3D Cu Micro Spot | < 30 | 17 | > 18 x 106 | Stress Analysis Micro-XRF Micro-XRD |
GeniX 3D Mo Micro Spot | < 55 | 10 | > 1.8 x 106 | Micro-XRF Micro-XRD |
GeniX 3D Cu High Convergence * | 60 | 70 x 35 | > 400 x 106 | Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film |
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Model | Detailed specifications |
Synchrotron scatterless slits (ā¦) | Please contact us for any technical information Discover what our customers say about it! |
X-ray alignment camera (ā¦) | Please contact us for any technical information |
Pin Diode detector (ā¦) | Please contact us for any technical information |
Beam stop with integrated Pin Diode | Please contact us for any technical information |
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Mirror type | Figure | Optic efficiency (calculated over mirror length for 70µm source) |
Standard Montel mirrors | Eff = 42% | |
Xenocs FOX 3D mirrors | Eff = 62% |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 3D Cu 14-39 (ā¦) | 0.19 x 0.19 | 5.4 | Protein crystallography (ā¦) Powder diffraction |
FOX 3D Cu 12-53 | 0.3 x 0.3 | 3 | Protein crystallography (Long Unit Cells) Powder diffraction |
FOX 3D Mo 10-31 | 0.13 x 0.13 | 4 | Small molecule crystallography High pressure diffraction |
FOX 3D Ag 10-30 | 0.13 x 0.13 | 3 | Small molecule crystallography High pressure diffraction |
FOX 3D Cr 8-30 | 0.20 x 0.20 | 6 | Protein crystallography (S-SAD) Stress analysis |
FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 2D Mo 25-25 (ā¦) | 0.08 x 0.08 | 5 | Small mollecule crystallography High pressure crystallography |
FOX 2D Cu 25-25 (ā¦) | 0.08 x 0.08 | 5.3 | Protein crystallography (ā¦) Micro Diffraction, Reflectometry |
FOX 3D Cu 21-21 HC (ā¦) | 0.08 x 0.08 | 70 x 35 | Rapid x-ray Reflectometry (full beam) Scanning x-ray Reflectometry (with slit) Micro-XRF |
FOX 3D Cu 28-10 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
FOX 3D Cr 30-8 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 2D Cu 12-INF (ā¦) | 1.2 x 1.2 | 1 | Small angle x-ray scattering (ā¦) High resolution x-ray diffraction (ā¦) Surface scattering (ā¦) Thin film analysis (reflectometry stress) (ā¦) Microdiffraction on synchrotron (ā¦) |
FOX 2D Mo 25-INF (ā¦) | 0.85 x 1.3 | 0.5 | Small angle x-ray scattering High resolution x-ray diffraction Surface scattering |
FOX 2D 12-60 L (ā¦) | 0.18 x 0.2 | 0.5 x 2 | High resolution diffraction Small sample analysis |
FOX 1D Cu 12-INF (ā¦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 1D Cu 12-INF (ā¦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
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Element of interest | Reference |
O, F, Na, Mg, Al, Si, P, S | XAN-1 |
Nitrogen | XAN-2 |
Carbon | XAN-3 |
Boron | XAN-4 |
Mg, Al , Si | XAN-5 |
Be | XAN-6 |
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