Washington, DC, USA
2016-05-22
2016-05-25
The Nanoscale Materials Characterization symposiumะย of NANOTECH 2016 is co-chaired by Greg Haugstadt from the University of Minnesota, Dalia Yablon from SurfaceChar LLC & Pierre Panine from Xenocs.
Among the many sessions & talks, we do highlight & recommend the ones below for their focus on the SAXS/WAXS technique and their broad range of nanomaterials investigated.
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- Monday May 23
1:30 ะย Session : “Characterization for Bio/Pharma Applications”
3:25 ะย ะย Incorporation study of Escin in DMPC vesicles by scattering methodsะย (invited presentation)
ะย ะย ะย ะย ะย R. Sreij, C. Dargel and T. Hellweg,ะย Bielefeld University, DE
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- Tuesday May 24
1:30 ะย Session : “Nanoparticle Characterization I”
1:30 ะย ะย Coping with the EU nano-definition: abilities and limitations of particle sizing with SAXSะย (invited presentation)
ะย ะย ะย ะย ะย B.R. Pauw,ะย Federal Institute for Materials Research and Testing (BAM), DE
1:55 ะย ะย Synchrotron X-ray scattering: the reference for high-resolution nanoparticle characterizationะย (invited presentation)
ะย ะย ะย ะย ะย E. Capria, M. Sztucki, N. Theyencher,ะย European Synchrotron Radiation Facility, FR
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- Wednesday May 25
8:30 ะย Session : “Characterization : Solution providers”
8:30 ะย Getting the inside view of nanomaterials with a SAXS/WAXS instrumentะย (invited presentation)
ะย ะย ะย ะย ะย F. Bossan, P. Panine, S. Rodrigues,ะย Xenocs, FR
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