Washington, DC, USA
2016-05-22
2016-05-25
The Nanoscale Materials Characterization symposiumВ of NANOTECH 2016 is co-chaired by Greg Haugstadt from the University of Minnesota, Dalia Yablon from SurfaceChar LLC & Pierre Panine from Xenocs.
Among the many sessions & talks, we do highlight & recommend the ones below for their focus on the SAXS/WAXS technique and their broad range of nanomaterials investigated.
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- Monday May 23
1:30 В Session : “Characterization for Bio/Pharma Applications”
В В В В В Session chair : Dalia Yablon, SurfaceChar LLC
В В В В В Location : National Harbor 13
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3:25 В В Incorporation study of Escin in DMPC vesicles by scattering methodsВ (invited presentation)
В В В В В R. Sreij, C. Dargel and T. Hellweg,В Bielefeld University, DE
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- Tuesday May 24
1:30 В Session : “Nanoparticle Characterization I”
В В В В В Session ChairВ : Pierre Panine, Xenocs, FR
В В В В В LocationВ : National Harbor 13
1:30 В В Coping with the EU nano-definition: abilities and limitations of particle sizing with SAXSВ (invited presentation)
В В В В В B.R. Pauw,В Federal Institute for Materials Research and Testing (BAM), DE
1:55 В В Synchrotron X-ray scattering: the reference for high-resolution nanoparticle characterizationВ (invited presentation)
В В В В В E. Capria, M. Sztucki, N. Theyencher,В European Synchrotron Radiation Facility, FR
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- Wednesday May 25
8:30 В Session : “Characterization : Solution providers”
В В В В В Session ChairВ : Pierre Panine, Xenocs, FR
В В В В В LocationВ : Potomac 5
8:30 В Getting the inside view of nanomaterials with a SAXS/WAXS instrumentВ (invited presentation)
В В В В В F. Bossan, P. Panine, S. Rodrigues,В Xenocs, FR
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