City College of New York
2017-07-09
2017-07-12
Xenocs will be attending theВ 91st annual meeting of the American Chemical Society Division of Colloid and Surface Chemistry.
Let’s meet there !
Home » ACS Colloids and Surface Science
City College of New York
2017-07-09
2017-07-12
Xenocs will be attending theВ 91st annual meeting of the American Chemical Society Division of Colloid and Surface Chemistry.
Let’s meet there !
Sealed tube micro sources are becoming a standard in x-ray analytical equipments as they provide high useful flux in a low cost of ownership, eco friendly package. Based on this technology, Xenocs has developed a high performance x-ray beam delivery system: the GeniX3D.
The combination of an innovative design and the FOX3D single reflection optics makes the GeniX3D a unique solution on the market. The GeniX3D stands out for its beam intensity, definition and stability, its ease of integration and reliability.
The GeniX3D comes in different energies and beam geometry to cover a large range of applications.
Thanks to its unique performance, ergonomics and reliability, the GeniX3D has become the reference among the leading Original Equipment Manufacturers of X-ray analytical equipments.
Model | Beam size at focus (µm) | Divergence (mrad) | Flux (ph/sec) | Typical application |
GeniX 3D Cu High Flux * | < 190 | 6 | > 400 x 106 | Protein crystallography Micro stress analysis Powder diffraction |
GeniX 3D Mo High Flux | < 130 | 5 | > 25 x 106 | Small Molecule crystallography High pressure |
GeniX 3D Cr High Flux | < 190 | 6 | > 300 x 106 | Stress Analysis |
GeniX 3D Cu High Convergence * | 60 | 70 x 35 | > 400 x 106 | Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film |
GeniX 3D Cu Low Convergence * | < 250 | 3 | > 120 x 106 | Small Angle X-ray Scattering Protein Crystallography |
* Configurations also available for low energy radiation (V, Cr)
Model | Beam size at focus (µm) | Divergence (mrad) | Flux (ph/sec) | Typical application |
GeniX 3D Cr Micro Spot | < 30 | 17 | > 12 x 106 | Stress Analysis Micro-XRF Micro-XRD |
GeniX 3D Cu Micro Spot | < 30 | 17 | > 18 x 106 | Stress Analysis Micro-XRF Micro-XRD |
GeniX 3D Mo Micro Spot | < 55 | 10 | > 1.8 x 106 | Micro-XRF Micro-XRD |
GeniX 3D Cu High Convergence * | 60 | 70 x 35 | > 400 x 106 | Rapid X-ray Reflectometry (full beam) Scanning x-ray reflectometry (with slit) Micro x-ray fluorescence Small spot diffraction on thin film |
* Configurations also available for low energy radiation (V, Cr)
Based on worldwide patents and more than 14 years of Research and Development, Xenocs is the only company in the world proposing single reflection multilayer optics. These optics offer typically 50% more efficiency than standard multiple reflection optics, also called Montel optics.
Based on its proprietary replication technology, Xenocs is able to offer innovative optical designs with unmatched performance, which up to now have been impossible to achieve with other existing manufacturing techniques.
Mirror type | Figure | Optic efficiency (calculated over mirror length for 70µm source) |
Standard Montel mirrors | Eff = 42% | |
Xenocs FOX 3D mirrors | Eff = 62% |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 3D Cu 14-39 (♦) | 0.19 x 0.19 | 5.4 | Protein crystallography (♦) Powder diffraction |
FOX 3D Cu 12-53 | 0.3 x 0.3 | 3 | Protein crystallography (Long Unit Cells) Powder diffraction |
FOX 3D Mo 10-31 | 0.13 x 0.13 | 4 | Small molecule crystallography High pressure diffraction |
FOX 3D Ag 10-30 | 0.13 x 0.13 | 3 | Small molecule crystallography High pressure diffraction |
FOX 3D Cr 8-30 | 0.20 x 0.20 | 6 | Protein crystallography (S-SAD) Stress analysis |
FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 2D Mo 25-25 (♦) | 0.08 x 0.08 | 5 | Small mollecule crystallography High pressure crystallography |
FOX 2D Cu 25-25 (♦) | 0.08 x 0.08 | 5.3 | Protein crystallography (♦) Micro Diffraction, Reflectometry |
FOX 3D Cu 21-21 HC (♦) | 0.08 x 0.08 | 70 x 35 | Rapid x-ray Reflectometry (full beam) Scanning x-ray Reflectometry (with slit) Micro-XRF |
FOX 3D Cu 28-10 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
FOX 3D Cr 30-8 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 2D Cu 12-INF (♦) | 1.2 x 1.2 | 1 | Small angle x-ray scattering (♦) High resolution x-ray diffraction (♦) Surface scattering (♦) Thin film analysis (reflectometry stress) (♦) Microdiffraction on synchrotron (♦) |
FOX 2D Mo 25-INF (♦) | 0.85 x 1.3 | 0.5 | Small angle x-ray scattering High resolution x-ray diffraction Surface scattering |
FOX 2D 12-60 L (♦) | 0.18 x 0.2 | 0.5 x 2 | High resolution diffraction Small sample analysis |
FOX 1D Cu 12-INF (♦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
FOX 1D Cu 12-INF (♦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
Based on its extended experience in multilayer coatings, surface shaping, and advanced metrology, Xenocs has developed a broad range of high performance XRF analyzer optics.
With its unique replication technology, Xenocs has developed new analyzer geometries that lead to improved lower limits of detection and increased measurement throughput.
Element of interest | Reference |
O, F, Na, Mg, Al, Si, P, S | XAN-1 |
Nitrogen | XAN-2 |
Carbon | XAN-3 |
Boron | XAN-4 |
Mg, Al , Si | XAN-5 |
Be | XAN-6 |
Please discover our offer and do not hesitate to contact us to talk about your project and your specific needs.
Model | Detailed specifications |
Synchrotron scatterless slits (♦) | Please contact us for any technical information Discover what our customers say about it! |
X-ray alignment camera (♦) | Please contact us for any technical information |
Pin Diode detector (♦) | Please contact us for any technical information |
Beam stop with integrated Pin Diode | Please contact us for any technical information |
Source | Microfocus sealed tube: Cu, 30W/30µm*, point focus. (* DIN EN 12543-5)MetalJet source D2+ (Ga).Motorized Dual source or triple source (Cu/Mo/Cr/Ga). |
Optics | Patented 2D single reflection multilayer optics. |
Detector | In-vacuum motorized 3-axis detectors for 2D SAXS/WAXS (Q-Xoom):--Pilatus3 R 300K hybrid photon counting detector--Eiger2 R (1M, 4M) hybrid photon counting detectorsOptional WAXS detectors for SWAXS:--Pilatus3 R 100K hybrid photon counting detector--Motorized 3-axis Eiger2 R 500K hybrid photon counting detector |
Sample chamber | Large vacuum chamber.On-axis sample viewing (parallax free).Attachments for operation of sample in air. |
Key features | Clean Beam technology: high flux and low background beamline.Beamstopless measurement: SAXS acquisition continuously without any beamstop.Q-Xoom: Automatic change of measurement configuration over all instrument Q-range with no movement of sample measuring position.Virtual detector mode: surfaces of detection > 200 mm² x 200 mm². |
Measurement capability | Nanoparticles size up to 300 nm, 500 nm or 900 nm in diameter depending on Xeuss model. Nanoparticles size up to > 2.5 microns with optional motorized Bonse-Hart module for automatic sequential USAXS/SAXS/WAXS measurements.Scattering measurements up to 2Ɵ>70° with Q-Xoom. Qmax > 49 nm-1 |
Sample environment | Standard holders (multi-samples): solids, capillaries, powders.Sample holders for powders and gels.Flowcells for liquids: --- Low noise flowcell --- Capillary flowcell --- Automatic Sample Changer --- BioCube measuring cell with dynamic monitoring (compatible with pipetting robot)Temperature stages: --- Multi-purpose X-Ray Temperature Stage (-30°C to 150°C) --- High temperature sample stage (-150°C to 350°C) --- Extended high temperature sample stage (amb - 1000°C)Tensile Stage (00-600N).Humidity stage (10%-90% from ambient to 60°C).Shear stageTemperature compatible GiSAXS stageOther sample stages available under request |
Software | Acquisition software with automatic data reduction in absolute units and live data display.XSACT (X-ray Scattering Analysis and Calculation Tool) for data analysis and interpretation. |
General parameters | Models & Footprint : Xeuss 3.0 C (1 m x 3 m), HR (1 m x 5 m), UHR (1 m x 8 m). Maximum power consumption: < 3000 W (single phase power) |
Advanced materials research and characterization could require integration of specific or customized sample environments.
Xeuss 3.0 is perfectly adapted for such new projects thanks to its state of the art beamline concept.
It provides:
In particular, the following key features enable the user to optimize experiments or results:
SAXS acquisition continuously without any beamstop provides High Dynamic Range data.
No parasitic scattering from beamstop edges or detector window allows noise-free scattering at low q.
The direct beam is recorded simultaneously with the sample scattering profile during acquisition for accurate transmitted intensity measurement, used to obtain a precise absolute intensity normalization.
In addition, the direct beam profile thus measured is integrated in the data analysis (XSACT) to improve the accuracy of the results.
As a standard solution, Xeuss 3.0 integrates low maintenance microfocus beam delivery systems to provide very high flux levels previously only possible with high power rotating anode sources.
Advanced experiments such as kinetic studies or shape analysis of diluted samples can now be performed in the lab.
In addition, Xenocs X-ray beam delivery systems coupled with motorized scatterless collimation achieve high resolution (low Δq beam), which is essential for studying large characteristic dimensions or for performing accurate mesophase analysis.
The high useful flux together with the high resolution capability are achieved through the combination of:
To ensure the best quality of X-ray scattering measurements, including on diluted or low contrast samples, Xeuss 3.0 combines high flux with low noise technology, which is the fruit of more than 10 years of development.
Key integrated features are:
For applications requiring very fast kinetics Xeuss 3.0 can also be delivered with a MetalJet source.
The Q-Xoom features full range computer-controlled detector travel to automatically adjust the sample-to-detector distance offering maximum flexibility of measurement for experiment optimization.
The virtual detector increases the measuring capabilities offering surfaces of collection larger than 200 mm2 x 200 mm2 at any sample-to-detector distance independently of detector size with automatic data reconstruction.
The large surface of detection is beneficial to optimize the azimuthal coverage in case of anisotropic samples or to benefit from high resolution measurement settings by characterizing smaller length scales (larger wave vectors) at longer sample to detector distance by a detector offset.
Advanced nanomaterials development and design require characterization over a large range of length scales. The Xeuss 3.0 offers such measuring capability over up to 5 orders in magnitude in q (wave vector) through entirely motorized change of configurations. Any trained user can thus operate the system remotely over its complete measurement range for a given sample or batch of samples.
Automatic change of measuring settings include:
– Q-Xoom change of measurement resolution through motorized translation of detector
– Sequential SAXS /USAXS measurement with Bonse-Hart USAXS module
– Change of energy radiation, up to 3 energies
– Movable WAXS detector for out of equilibrium in situ SWAXS studies