21-24 November, 2023.
Xenocs is pleased to attend the 15th Rayons X et Matière Conference from November 21-24 in Bordeaux, France. Meet us at our booth!
Rayons X et Matière 2023
Xenocs is pleased to attend the 15th Rayons X et Matière Conference from November 21-24 in Bordeaux, France. Meet us at our booth!
当社は、数々の国際特許と14年あまりに及ぶ研究開発に基づき、業界唯一の単一反射多層膜光学系を開発しています。これらの光学機器では一般に、標準的な多反射光学系に比べて効率が50%以上高くなります。
Xenocsは、自社独自の複製技術により、従来の製造技術では不可能であった比類ない性能を誇る光学設計を実現します。
| Mirror type | Figure | Optic efficiency (calculated over mirror length for 70µm source) |
| Standard Montel mirrors |  | Eff = 42% |
| Xenocs FOX 3D mirrors |  | Eff = 62% |
| Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
| FOX 3D Cu 14-39 (♦) | 0.19 x 0.19 | 5.4 | Protein crystallography (♦) Powder diffraction |
| FOX 3D Cu 12-53 | 0.3 x 0.3 | 3 | Protein crystallography (Long Unit Cells) Powder diffraction |
| FOX 3D Mo 10-31 | 0.13 x 0.13 | 4 | Small molecule crystallography High pressure diffraction |
| FOX 3D Ag 10-30 | 0.13 x 0.13 | 3 | Small molecule crystallography High pressure diffraction |
| FOX 3D Cr 8-30 | 0.20 x 0.20 | 6 | Protein crystallography (S-SAD) Stress analysis |
| FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
| Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
| FOX 2D Mo 25-25 (♦) | 0.08 x 0.08 | 5 | Small mollecule crystallography High pressure crystallography |
| FOX 2D Cu 25-25 (♦) | 0.08 x 0.08 | 5.3 | Protein crystallography (♦) Micro Diffraction, Reflectometry |
| FOX 3D Cu 21-21 HC (♦) | 0.08 x 0.08 | 70 x 35 | Rapid x-ray Reflectometry (full beam) Scanning x-ray Reflectometry (with slit) Micro-XRF |
| FOX 3D Cu 28-10 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
| FOX 3D Cr 30-8 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
| Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
| FOX 2D Cu 12-INF (♦) | 1.2 x 1.2 | 1 | Small angle x-ray scattering (♦) High resolution x-ray diffraction (♦) Surface scattering (♦) Thin film analysis (reflectometry stress) (♦) Microdiffraction on synchrotron (♦) |
| FOX 2D Mo 25-INF (♦) | 0.85 x 1.3 | 0.5 | Small angle x-ray scattering High resolution x-ray diffraction Surface scattering |
| FOX 2D 12-60 L (♦) | 0.18 x 0.2 | 0.5 x 2 | High resolution diffraction Small sample analysis |
| FOX 1D Cu 12-INF (♦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
| Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
| FOX 1D Cu 12-53 | 0.3 | 3 | XRD, Powder Diffraction |
| Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
| FOX 1D Cu 12-INF (♦) | 1.2 | 0.8 | High resolution x-ray diffraction, Powder diffraction, Reflectometry, Small angle x-ray scattering |
Xenocsは、多層膜コーティングおよび表面加工における豊富な経験と先端計測技術に基づき、高性能XRF蛍光分析用光学系を広範囲にわたって開発しています。
自社独自の複製技術を生かして開発された新しい分析器の構造により、検出下限値と測定処理能力が向上します。
| Element of interest | Reference |
| O, F, Na, Mg, Al, Si, P, S | XAN-1 |
| Nitrogen | XAN-2 |
| Carbon | XAN-3 |
| Boron | XAN-4 |
| Mg, Al , Si | XAN-5 |
| Be | XAN-6 |