Presented by

Dr. Tra Nguyen

Tra Nguyen is Application Group Manager at Xenocs, where he supports researchers in understanding and controlling the structu … Tra Nguyen is Application Group Manager at Xenocs, where he supports researchers in understanding and controlling the structure of their materials at the nanoscale. He holds a PhD in silicon photonics and gained extensive experience as an R&D scientist at synchrotron facilities before joining Xenocs in 2020. His background spanning both large-scale synchrotron infrastructures and lab-based X-ray scattering instrumentation gives him a unique perspective on the practical realities of SAXS experimentation.

Organizer

Dr. Rob Taylor

robert.taylor@xenocs.com

Product Marketing Manager at Xenocs

Event registration

Small-Angle X-ray Scattering: From X-rays to Nanoscale Insight

Webinar

14/04/2026

15:00

Understanding the nanoscale structure of materials is a key challenge across fields from structural biology and pharmaceutical development to polymers and energy storage materials. Small-Angle X-ray Scattering (SAXS) addresses this directly: a non-destructive technique that probes structure at the nanometer scale, on samples in near-native conditions, with minimal preparation. Demand for this technique is now increasing as cutting-edge technology is bringing synchrotron capability to the lab.

This introductory webinar is designed for researchers and industry professionals who are new to SAXS or considering incorporating it into their analytical toolkit. We will cover the core principles of X-ray scattering, how structural information is extracted from scattering profiles, and what a modern SAXS instrument looks like in practice. We will also show how other analytical techniques complement SAXS data and contribute to the understanding of how nanoscale structures impact material properties.

By the end of the session, you will have a solid, practical foundation of how SAXS works, typical experimental workflows, sample requirements, and best practices for data collection and analysis.

X-rays and matter: wavelengths, interaction with materials, and why X-rays are uniquely suited to probing structure at the nanoscale.

The principles of SAXS: how nanoscale structural information is encoded in a scattering profile and what can be resolved.

The key components of a modern lab-based SAXS instrument and how it compares to synchrotron sources in terms of capabilities and trade-offs.

How SAXS fits into a broader characterization workflow: from sample requirements and data collection to complementary techniques and real-world applications.

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Small-Angle X-ray Scattering: From X-rays to Nanoscale Insight

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