GISAXS: Nanoscale Characterization of Surfaces and Interfaces

While SAXS and WAXS probe the bulk structure of materials, many of the most technologically relevant systems organize their structure at or near a surface. Thin films, coatings, and interfaces are prime examples. Characterizing this surface structure requires a different approach.

Grazing-Incidence Small-Angle X-ray Scattering (GISAXS) addresses this directly. By combining the surface sensitivity of grazing-incidence geometry with the statistical power of small-angle scattering, GISAXS enables detailed characterization of in-plane and out-of-plane nanoscale morphology in systems ranging from block copolymer films and nanoparticle assemblies to porous coatings and functional multilayers.

Building on the principles introduced in Parts 1 and 2, this webinar explains how GISAXS differs from transmission SAXS, what structural information it uniquely provides, and how to set up and interpret a GISAXS measurement in practice. We will cover instrument geometry, key experimental considerations, and data interpretation, illustrated with application examples across materials science and industry.

By the end of this session, you will have a clear understanding of what GISAXS can reveal, when to use it, and how it completes the picture alongside SAXS and WAXS.