Environmental standards and production facilities continuously require higher performance X-ray fluorescence (XRF) and electron probe micro analysis (EPMA) techniques. These two analytical techniques enable the identification and quantification of elements in materials. Multilayer monochromators are recognized as the standard for the analysis and detection of light elements (from Boron through to Silicon).

Unfortunately multilayer analysers saw little innovation in the 20 years following their introduction. However, Xenocs is now introducing its new line of multilayer analysers that lead to improved lower limits of detection and throughput. For further details on these products do not hesitate to send us the requirement form hereunder.

Requirement form