XRF Analysers
Environmental standards and production facilities continuously require higher performance X-ray fluorescence (XRF) and electron probe micro analysis (EPMA) solutions. These two analytical techniques enable the identification and quantification of elements in materials.A unique technology for advanced XRF solution
Multilayer monochromators are recognized as the standard for the analysis and detection of light elements (from Boron through to Silicon).
Based on its extended experience in multilayer coatings, surface shaping, and advanced metrology, XENOCS has developed a broad range of high performance XRF analyzer optics.
With its unique replication technology, XENOCS has developed new analyzer geometries that lead to improved lower limits of detection and throughput.
Discover our product range
Please have a look through this page to learn more about our product range or go to our applications section to find the right product for your application and get customer testimonials.
XRF Optics
| Element of interest | Reference |
|---|---|
| O, F, Na, Mg, Al, Si, P, S | XAN-1 |
| Nitrogen | XAN-2 |
| Carbon | XAN-3 |
| Boron | XAN-4 |
| Mg, Al , Si | XAN-5 |
| Be | XAN-6 |
