2D beam shaping x Ray optics
The introduction of multilayer optics in the late seventies allowed a tremendous gain in the focalization of x-rays, enabling the development of innovating x-ray based techniques for in lab material analysis.
History
The development of x-ray analytical applications and the requirement for better sample illumination accelerated the development of x-ray beam conditioning optics with first the introduction of 1D beam shaping optics and then in the late nineties the 2D beam shaping optics. The two dimensional beam shaping was first achieved by the combination of two 1-dimensional focusing optics in the Montel geometry.
While enabling an efficient 2-dimensional focalization, Montel optics are facing limitations due to the flux loss at each reflection and difficulty to achieve advanced geometries. x-ray multilayer optics manufacturers have done tremendous efforts up to now to push this concept to its limit.
An innovative single reflection optical design
Xenocs came to the market in 2002 with a proprietary innovative single reflection optical design to overcome these limitations. With the introduction of the FOX2D product line, Xenocs proposed a versatile solution with significant flux gain due to its single reflection concept compared to traditional Montel design.
FOX3D product line: Unmatched performance
With the recent introduction of the FOX 3D product line, based on its proprietary replication technology, Xenocs is moving a step further in performance by enabling the production of new optical designs with unmatched performances.
FOX 3D optics are based on a truly aspheric design providing high precision beam shaping with ultimate performances.
A new standard for high performance
Hundreds of research groups around the world and renowned Original Equipment Manufacturers of the x-ray analytical market trust Xenocs to provide them with the best solution to fulfill their requirements. With its extended experience and customer reference, Xenocs is definitely imposing single reflection optics as the new standard for high performance x-ray optics for the analytical industry.
Discover our product range
Please have a look through this page to learn more about our product range or go to our applications section to find the right product for your application and get customer testimonials.
High Flux Optics
| Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
|---|---|---|---|
| FOX 3D CU 14-39 | 0.19 x 0.19 | 5.4 | Protein crystallography Powder diffraction |
| FOX 3D CU 12-53 | 0.3 x 0.3 | 3 | Protein crystallography (Long Unit Cells) Powder diffraction |
| FOX 3D MO 10-31 | 0.13 x 0.13 | 4 | Small molecule crystallography High pressure diffraction |
| FOX 3D AG 10-30 | 0.13 x 0.13 | 3 | Small molecule crystallography High pressure diffraction |
| FOX 3D CR 8-30 | 0.20 x 0.20 | 6 | Protein crystallography (S-SAD) Stress analysis |
Small Spot Optics
| Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
|---|---|---|---|
| FOX 2D MO 25-25 | 0.08 x 0.08 | 5 | Small mollecule crystallography High pressure crystallography |
| FOX 2D CU 25-25 | 0.08 x 0.08 | 5.3 | Protein crystallography Micro Diffraction, Reflectometry |
| FOX 3D CU 21-21 HC | 0.08 x 0.08 | 70 x 35 | Rapid x-ray Reflectometry (full beam) Scanning x-ray Reflectometry (with slit) Micro-XRF |
| FOX 3D CU 28-10 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
| FOX 3D CR 30-8 | 0.04 x 0.04 | 17 | Stress Analysis, Micro-diffraction, Micro-XRF |
Collimating Optics
| Model | Beam size at focus (mm) with 60 µm source | Divergence (mrad) | Typical application |
|---|---|---|---|
| FOX 2D CU 12-INF | 1.2 x 1.2 | 1 | Small angle x-ray scattering High resolution x-ray diffraction Surface scattering Thin film analysis (reflectometry stress) Microdiffraction on synchrotron |
| FOX 2D MO 25-INF | 0.85 x 1.3 | 0.5 | Small Angle x-ray Scattering High Resolution x-ray Diffraction Surface scattering |
| FOX 2D 12-60 L | 0.18 x 0.2 | 0.5 x 2 | High resolution diffraction Small sample analysis |
| FOX 3D CU 12-INF | 1.1 x 1.5 | 0.8 | Small Angle x-ray scattering High Resolution x-ray diffraction Surface scattering Thin film analysis (reflectometry stress) |
