Based on our extensive experience in shaping X-ray beams by controlling the spot size, divergence, and spectral purity, Xenocs has developed a new product range of analyzers for demanding applications. Successful measurements require high signal, low background, effective second order extinction, and excellent energy resolution. Meeting these requirements lowers the detection limit and leads to higher precision analysis.
At a system level as well, Xenocs doubly focusing analyzers lead to improvement. Since the optic creates a small beam spot, the detector entrance can be strongly apertured to limit background noise. Moreover, traditional gasflow detectors can be replaced by more economic small area silicon drift diodes that offer better energy discrimination.
Our Gen 3 aspheric shaped multilayer mirrors are already available for B, N, O, C or As analysis and provide superior performance, allowing fast and accurate analysis.


If you have questions or if you would like to know more about this solution please contact us.