The SAXS/WAXS laboratory beamline
For many years, high performance SAXS measurements were limited to synchrotrons, as only such large facilities were able to simultaneously achieve high brilliance, low parasitic scattering, high resolution & versatility.
With the introduction of the Xeuss a few years ago, Xenocs made these four key parameters available to the home lab, opening the way to new SAXS/WAXS measurement capabilities.
Xenocs is now pleased to be introducing a new generation of SAXS/WAXS system : Xeuss 2.0
The Xeuss 2.0 was designed as a beamline for your own lab
It is the ouput of more than 14 years of R&D in the company and integrates all the innovative technological bricks developed by Xenocs all along these years. The Xenocs proprietary single reflection optics together with Xenocs new generation of scatterless slits generate a very intense X-ray beam with an ultra low level of parasitic signal. The Xeuss 2.0 also integrates the latest generation Pilatus detectors from Dectris for unmatched measurement capabilities.
Video: Xeuss 2.0 A Beamline For Your Lab
Video: Advantages of the SAXS/WAXS technique
The unique performance of the Xeuss 2.0 is enhanced by a powerful software package for system control, data acquisition & analysis. Based on SPEC from Certified Scientific Software, the Xeuss 2.0 control & data acquisition software features both easy to use graphical user interface and macro script mode for quick system access and advanced operations. The Xeuss 2.0 data processing & analysis software was developed on the basis of an exclusive partnership with Soleil synchrotron in France.
Benefitting from the experience of our customers, the Xeuss 2.0 also combines full flexibility and ergonomics. It is an open system, adaptable and upgradable to meet the needs of your application and experimental environment.
Please contact us to get more information on the Xeuss 2.0 !
November 4, 2016
“We want to be a partner with our vendor and based on the depth of interaction provided during the evaluation process, we were convinced that XENOCS is able and willing to provide that deeper relationship.”
Nichole M. Wonderling
Materials Characterization Laboratory, The Pennsylvania State University
October 25, 2016
“The Xeuss 2.0 HR is built with components currently in use in several world-class leading synchrotron research facilities [...]”
Dr. José Leobardo Bañuelos
Department of Physics, The University of Texas at El Paso
June 14, 2016
“We always wanted to have a facility of this kind which would enable us to perform most of our measurements here in Sheffield with an access 24/7/365.”
Dr. Oleksandr Mykhaylyk
Department of Chemistry, University of Sheffield, UK
May 13, 2016
“I have found the team at Xenocs not only technically superbly competent but also scientifically very experienced. And in the small angle scattering field it is a very important aspect because you need expert advice both in research as well as in technical instrumentation in order to make the best use of saxs instruments.”
Dr Youli Li, Prof. Dimitri Ivanov, Prof. Yongfeng Men
Clean Beam Technology
The performance of the Xeuss 2.0 relies on Xenocs proprietary Clean Beam Technology.
Video: Xenocs Clean Beam Technology
The GeniX3D microsource
Requiring only 30 W of power and producing a 30 µm spot size, the GeniX3D has a power density 10 times higher than a 1.2 kW sealed tube! This amazing technology yields higher beam intensity on the sample, higher beam stability, longer lifetime and lower cost of ownership.
The FOX3D single reflection optics
Xenocs is the only company in the world providing single reflection optics. These unique optics generate a highly collimated beam (divergence <0.4 mrad) with typically 50 % more efficiency than is produced with conventional multiple reflection optics (eg. Montel optics).
Scatterless slits 2.0
Covered by a worldwide patent, our innovative scatterless slits concept enables a factor of 10 of background reduction compared to other scatterless solution on the market.
This unique technology, not available to any other suppliers on the market, enables the Xeuss 2.0 to achieve unique qmin values down to 0.01 nm-1 and a typical signal-to-noise ratio over 9 decades leading to ultimate performance SAXS/WAXS measurements in the lab.
Maximum versatility and ergonomics
The Xeuss 2.0 has been designed as an open SAXS/WAXS laboratory beamline, combining unique versatility and automation.
The system features automatic change of settings, auto-alignment, remote multiple sample measurements (allowing unattended overnight measurements, for maximum throughput).
The sample to detector distance is easily adjusted within only a few minutes, without the need for any beamstop realignment.
The Xeuss 2.0 features a large sample chamber which is set up to operate either in vacuum or in air. It can hold a large range of sample holders for transmission and grazing incidence, temperature stages, humidity cell, tensile stage, shear cells, low noise flow cell with autosampler, etc to best fit any application need. For integration of large sample environments both the sample stage and chamber may be removed to offering unique integration possibilities.
Video: Ahead of innovation_Xenocs Dual Source Module
Video: Ahead of innovation _ U-SAXS
Unique detection capability on the market
The Xeuss 2.0 features the most advanced detection capability on the market. Based on a close collaboration with Dectris, the Xeuss 2.0 integrates both the standard Pilatus3 and Eiger detectors as well as custom made detectors for unique detection integration.
The Xeuss 2.0 also integrates a proprietary hybrid pixel SWAXS module, offering the unique capability to run simultaneous SAXS/WAXS measurement.
Video: Ahead of innovation _ SWAXS
The ultimate Xeuss 2.0 configuration is equipped with the Pilatus3 1M and the SWAXS module thus offering the unique capability in one single shot to cover a q range between 0.03 nm-1 up to 40 nm-1. The SAXS detector position can easily be adjusted in only a few minutes, without any beamstop realignment, to provide access to lower qmin values (down to 0.01 nm-1 in ultimate configuration).
Video: Ahead of innovation _ Integrating Cutting Edge Detector Technology
Powerful and user friendly software suite
The unique performance of the Xeuss 2.0 is enhanced by a powerful and user friendly software package for system control, data acquisition and analysis.
Video: Xeuss 2.0 software suite
The Xeuss 2.0 system control and data acquisition software features both a graphical user interface and a macroscript mode, providing both ease of use and evolved data acquisition protocols.
The Xeuss 2.0 data processing and analysis software enables an easy treatment of 2D and 1D data for SAXS, GISAXS, WAXS and SWAXS, through its graphical user interface. Preliminary structure parameters are available. It is based on an exclusive collaboration with the Soleil synchrotron in France for continuous development of new features and topnotch capabilities.
Discovery Mode with Pilatus3 R 1M and SWAXS module
The Discovery Mode enables to reveal the full structure of your sample without changing sample-to-detector distance.
Low Noise Flow Cell
The use of the Xenocs Low Noise Flow Cell enables the minimization of container scattering and allows water scattering detection for a short exposure time.
Unique Signal-to-Noise ratio
The Xeuss 2.0 SAXS/WAXS system provides a high signal-to-noise ratio, allowing reliable data analysis of highly diluted systems.
High performance scatterless slits 2.0
Xenocs new generation of Scatterless slits 2.0 is compared to other existing commercial solutions available for beam collimation with low parasitic scattering.
High resolution capabilities with the Xeuss 2.0 SAXS/WAXS system
The ability of the Xeuss 2.0 SAXS/WAXS system to reveal the sample nanostructure is directly related to its ability to achieve low detected wave vector (qmin) values, without compromising angular resolution.
With a large choice of available lengths, source energy, detection type and optional sample environments, Xeuss 2.0 can be configured to best fit any application need.
|Dual energy Mo/Cu/Cr|
|Optional sample stages|
Technical data sheets
Xeuss 2.0 with Cu source
Xeuss 2.0 with Mo source
SWAXS module for Xeuss 2.0 SAXS/WAXS system
The SWAXS option is a new feature that extends the capability of the Xeuss 2.0 SAXS / WAXS system to real time simultaneous SAXS / WAXS data acquisition.
The ultimate performance, versatility and large range of sample environments of the Xeuss 2.0 make it a unique solution to support many applications.
Video: SAXS in polymer science
Polymer phase transformation
Simultaneous SAXS/WAXS measurements of a semi-crystalline polymer during thermal processing enables determination of route for phase transformation.
Determination of polymer crystallinity
The level of crystallinity of a polyolefin was determined during a kinetic experiment using the Xeuss 2.0 SAXS/WAXS system in combination with an integrated temperature control stage, the Linkam HFSX350.
Low detection limit of crystallinity
Low polyolefin crystallinity fraction down to 0.3 % was determined during a kinetic experiment using the Xeuss 2.0 SAXS/WAXS system in combination with an integrated temperature control stage, the Linkam HFSX350.
Protein structure resolution
SAXS/WAXS investigation of the protein Sub-unit F of the eukaryotic V1V0 ATPase was performed using the Xeuss 2.0 SAXS/WAXS system, leading to its structure resolution.
Silk fiber nanostructure investigation
SAXS/WAXS measurements enable the determination of the characteristic dimensions and the semi-crystalline structure of Bombyx mori cocoon silk fibers.
Investigation of Gold Nanoparticles
Shape and size of gold nanoparticles (NPs) in suspension have been determined by SAXS measurement.
Willing to make measurements and tests related to your application? Do not hesitate to contact us!
Songlin Liu, Xiaoshan Fan, Chaobin He
Composites Science and Technology, 2016, 125, pp 132-140
Cian Cummins, Parvaneh Mokarian-Tabari, Pascal Andreazza, Christophe Sinturel, Michael A. Morris
ACS Applied Materials and Interfaces, 2016, 8 (12), pp 8295-8304
Xiangwei Zhu, Benzheng Xia, Kun Lu, Huan Li, Ruimin Zhou, Jianqi Zhang, Yajie Zhang, Zhigang Shuai, Zhixiang Wei
Chemistry of Materials, 2016, 28 (3), pp 943-950